{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T11:10:22Z","timestamp":1771067422486,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2015,3,1]],"date-time":"2015-03-01T00:00:00Z","timestamp":1425168000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/tr.2014.2338252","type":"journal-article","created":{"date-parts":[[2014,7,25]],"date-time":"2014-07-25T18:38:41Z","timestamp":1406313521000},"page":"435-443","source":"Crossref","is-referenced-by-count":21,"title":["The Reliability of Coherent Systems Subjected to Marshall\u2013Olkin Type Shocks"],"prefix":"10.1109","volume":"64","author":[{"given":"Ismihan","family":"Bayramoglu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Murat","family":"Ozkut","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s00362-006-0024-5"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00362-009-0287-8"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2006.01.012"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1520-6750(199908)46:5<507::AID-NAV4>3.0.CO;2-D"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2008.06.012"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2009.07.026"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2011.05.006"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/24.46492"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/24.249597"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/84.3.641"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2054170"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s001840300287"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2010.04.030"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"64","DOI":"10.1504\/IJOR.2012.048292","article-title":"<formula formulatype=\"inline\"><tex Notation=\"TeX\">$m$<\/tex><\/formula>-consecutive-<formula formulatype=\"inline\"><tex Notation=\"TeX\">$k$<\/tex><\/formula>-out-of-<formula formulatype=\"inline\"><tex Notation=\"TeX\">$n:{\\rm F}$<\/tex><\/formula> system with overlapping runs: Signature-based reliability analysis","volume":"15","author":"eryilmaz","year":"2012","journal-title":"Int J Oper Res"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X12474155"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/03610920601126571"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1080\/02664760500165008"},{"key":"ref2","author":"barlow","year":"1975","journal-title":"Statistical Theory of Reliability and Life Testing"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1111\/1467-842X.00072"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2241152"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.2307\/2282907"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1981.5221189"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2005.09.003"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1985.5221935"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1993.10476434"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2006.07.007"},{"key":"ref25","author":"samaniego","year":"2007","journal-title":"System Signatures and Their Applications in Engineering Reliability (International Series in Operations Research & Management Science"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/7051309\/06866252.pdf?arnumber=6866252","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:40:48Z","timestamp":1642005648000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6866252\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":27,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2014.2338252","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,3]]}}}