{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T03:26:27Z","timestamp":1780543587591,"version":"3.54.1"},"reference-count":56,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2015,3,1]],"date-time":"2015-03-01T00:00:00Z","timestamp":1425168000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/tr.2014.2354931","type":"journal-article","created":{"date-parts":[[2014,9,24]],"date-time":"2014-09-24T20:08:23Z","timestamp":1411589303000},"page":"15-30","source":"Crossref","is-referenced-by-count":15,"title":["Exploring Data-Level Error Tolerance in High-Performance Solid-State Drives"],"prefix":"10.1109","volume":"64","author":[{"given":"Xin","family":"Xu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"H. Howie","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/SIPS.2010.5624877"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0130"},{"key":"ref33","year":"0","journal-title":"Samsung SSD SM825"},{"key":"ref32","article-title":"Solid state drive (SSD) requirements and endurance test method","year":"0"},{"key":"ref31","year":"2010","journal-title":"Establishing Industry Endurance Standards for Solid State Storage"},{"key":"ref30","year":"0","journal-title":"PNY Prevail SSD"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1974.1100705"},{"key":"ref36","author":"draper","year":"1981","journal-title":"Applied regression analysis"},{"key":"ref35","year":"2009","journal-title":"OCZ Vertex SSD Specification"},{"key":"ref34","year":"0","journal-title":"ATA\/ATAPI Command Set S M A R T"},{"key":"ref28","article-title":"The bleak future of NAND flash memory","author":"grupp","year":"2012","journal-title":"Proc USENIX Conf File and Storage Technologies"},{"key":"ref27","article-title":"NAND flash qualification guideline","author":"heidecker","year":"2012","journal-title":"NEPP Electronic Technology Workshop"},{"key":"ref29","article-title":"Barracuda data sheet","year":"0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1519065.1519081"},{"key":"ref1","article-title":"Micron P400m enterprise SATA SSD datasheet","year":"0"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2005.58"},{"key":"ref22","article-title":"Best-effort parallel execution framework for recognition and mining applications","author":"meng","year":"2009","journal-title":"Proc IEEE Int Symp Parallel&Distributed Processing"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2007.4341443"},{"key":"ref24","first-page":"1","article-title":"Exploiting application-level correctness for low-cost fault tolerance","volume":"10","author":"li","year":"2008","journal-title":"J Instruction-Level Parallelism"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2007.346196"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1993498.1993518"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1950365.1950391"},{"key":"ref50","year":"2011","journal-title":"Apache Hadoop Website"},{"key":"ref51","article-title":"Efficient computation of frequent and top-k elements in data streams","author":"metwally","year":"2005","journal-title":"Proc Int l Conf Database Theory"},{"key":"ref56","author":"mariano","year":"2012","journal-title":"ECC Options for Improving NAND Device Reliability"},{"key":"ref55","year":"0"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809071"},{"key":"ref53","year":"2011"},{"key":"ref52","article-title":"Just-in-time analytics on large file systems","author":"huang","year":"2011","journal-title":"Proc 9th USENIX Conf File and Storage Technologies (FAST)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MASCOTS.2010.15"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1127777.1127833"},{"key":"ref40","author":"lin","year":"1983","journal-title":"Error Control Coding Fundamentals and Applications"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2006.354942"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.32"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763156"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.812098"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558857"},{"key":"ref17","article-title":"Qualifying reliability of solid-state storage from multiple aspects","author":"sun","year":"2011","journal-title":"Proc 7th IEEE Int Workshop Storage Network Architecture and Parallel I\/O"},{"key":"ref18","article-title":"Design tradeoffs for SSD performance","author":"agrawal","year":"2008","journal-title":"Proc Usenix Annual Technical Conf"},{"key":"ref19","article-title":"A definition of soft computing","author":"jin","year":"0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669118"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555371"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.811702"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1254882.1254917"},{"key":"ref8","article-title":"Improving NAND reliability with low-density parity check codes (LDPC)","author":"yu","year":"2011","journal-title":"Proc Flash Summit"},{"key":"ref7","year":"2011","journal-title":"?What Types of ECC Should be Used on Flash Memory??"},{"key":"ref49","author":"bienia","year":"2011","journal-title":"Benchmarking Modern Multiprocessors"},{"key":"ref9","article-title":"Energy efficient circuits for LDPC decoding","author":"gaudet","year":"2007"},{"key":"ref46","article-title":"Understanding soft error propagations using efficient vulnerability-driven fault injection","author":"xu","year":"2012","journal-title":"Proc Int Conf Dependable Systems and Networks"},{"key":"ref45","article-title":"SPC trace file format specification","year":"2002"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2009.02.010"},{"key":"ref47","article-title":"DUAL: Reliability-aware power management in data centers","author":"xu","year":"2013","journal-title":"Proc 1st Int Symp Cluster Computing and the Grid"},{"key":"ref42","year":"0","journal-title":"Intel 510 SSD Specification"},{"key":"ref41","doi-asserted-by":"crossref","DOI":"10.7551\/mitpress\/4347.001.0001","author":"gallager","year":"1963","journal-title":"Low Density Parity Check Codes"},{"key":"ref44","year":"0"},{"key":"ref43","article-title":"Postmark: A new file system benchmark","author":"katcher","year":"0"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/7051309\/06909080.pdf?arnumber=6909080","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:40:49Z","timestamp":1642005649000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6909080\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":56,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2014.2354931","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,3]]}}}