{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,5]],"date-time":"2025-10-05T21:54:33Z","timestamp":1759701273807},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2015,12,1]],"date-time":"2015-12-01T00:00:00Z","timestamp":1448928000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/tr.2015.2436374","type":"journal-article","created":{"date-parts":[[2015,6,2]],"date-time":"2015-06-02T00:56:15Z","timestamp":1433206575000},"page":"1383-1392","source":"Crossref","is-referenced-by-count":12,"title":["A Bayesian Method for Planning Accelerated Life Testing"],"prefix":"10.1109","volume":"64","author":[{"given":"Ancha","family":"Xu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yincai","family":"Tang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"crossref","first-page":"115","DOI":"10.1109\/TR.2010.2040758","article-title":"Accelerated life test plans for repairable systems with multiple independent risks","volume":"59","author":"liu","year":"2010","journal-title":"IEEE Trans Rel"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.2307\/1268710"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.2307\/1267923"},{"key":"ref30","first-page":"195","author":"ghosh","year":"1992","journal-title":"Bayesian Statistics"},{"key":"ref36","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-4286-2","author":"berger","year":"1985","journal-title":"Statistical Decision Theory and Bayesian Analysis"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2083251"},{"key":"ref34","author":"robert","year":"2005","journal-title":"Monte Carlo Statistical Methods"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.890897"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.903292"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/nav.21545"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2307\/1269733"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2013.810257"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2008.05.046"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194351"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-4459-7_12"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-3758(00)00126-9"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1198\/004017005000000373"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/03610926.2012.705942"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847247"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2011.04.009"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2307\/1266575"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.890885"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2013.03.021"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.853289"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2012.02.029"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2160748"},{"key":"ref2","author":"meeker","year":"1998","journal-title":"Statistical Methods for Reliability Data"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1214\/13-AOAS666"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1002\/9780470316795","author":"nelson","year":"1990","journal-title":"Accelerated testing"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2170104"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177728069"},{"key":"ref21","first-page":"340","article-title":"Letter to the Editor: The Kullback-Leibler distance","volume":"41","author":"kullback","year":"1987","journal-title":"Amer Statistician"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1989.10478756"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"113","DOI":"10.1111\/j.2517-6161.1979.tb01066.x","article-title":"Reference posterior distributions for Bayesian inference (with discussion)","volume":"41","author":"bernardo","year":"1979","journal-title":"J Roy Statist Soc Ser B"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1198\/016214501753382282"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/BF02564432"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/7337501\/07115973.pdf?arnumber=7115973","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,9]],"date-time":"2024-06-09T09:01:51Z","timestamp":1717923711000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7115973\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":36,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2015.2436374","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,12]]}}}