{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T14:57:55Z","timestamp":1773413875057,"version":"3.50.1"},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2016,3,1]],"date-time":"2016-03-01T00:00:00Z","timestamp":1456790400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/100008982","name":"Qatar National Research Fund","doi-asserted-by":"crossref","award":["NPRP 4-631-2-233"],"award-info":[{"award-number":["NPRP 4-631-2-233"]}],"id":[{"id":"10.13039\/100008982","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/tr.2015.2441095","type":"journal-article","created":{"date-parts":[[2015,6,16]],"date-time":"2015-06-16T18:38:23Z","timestamp":1434479903000},"page":"197-207","source":"Crossref","is-referenced-by-count":40,"title":["First and Last Triggering Event Approaches for Replacement With Minimal Repairs"],"prefix":"10.1109","volume":"65","author":[{"given":"Xufeng","family":"Zhao","sequence":"first","affiliation":[]},{"given":"Khalifa N.","family":"Al-Khalifa","sequence":"additional","affiliation":[]},{"given":"Abdel Magid","family":"Hamouda","sequence":"additional","affiliation":[]},{"given":"Toshio","family":"Nakagawa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2012.05.035"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2337811"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/9781118701881.ch14"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2014.11.018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2005.01.032"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/1-85233-841-5_18"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2012.04.028"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2011.10.025"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2013.11.011"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.10.017"},{"key":"ref2","author":"barlow","year":"1965","journal-title":"Mathematical Theory of Reliability"},{"key":"ref1","author":"nakagawa","year":"2005","journal-title":"Maintenance Theory of Reliability"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"95","DOI":"10.1109\/TR.2011.2182222","article-title":"A general imperfect repair model considering time-dependent repair effectiveness","volume":"61","author":"yuan","year":"2012","journal-title":"IEEE Trans Rel"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/7422884\/7124545.pdf?arnumber=7124545","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:48:45Z","timestamp":1642006125000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7124545\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":13,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2015.2441095","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,3]]}}}