{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T00:05:37Z","timestamp":1768349137749,"version":"3.49.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2015,12,1]],"date-time":"2015-12-01T00:00:00Z","timestamp":1448928000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/tr.2015.2447111","type":"journal-article","created":{"date-parts":[[2015,7,7]],"date-time":"2015-07-07T21:23:36Z","timestamp":1436304216000},"page":"1229-1242","source":"Crossref","is-referenced-by-count":14,"title":["Dynamic Function Verification for System on Chip Security Against Hardware-Based Attacks"],"prefix":"10.1109","volume":"64","author":[{"given":"Lok-Won","family":"Kim","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John D.","family":"Villasenor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/54.199799"},{"key":"ref30","year":"2012","journal-title":"Coverage Technology User Guide"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687424"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.18"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513114"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2093547"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref15","article-title":"Integrated circuit security?New threats and solutions","author":"abramovici","year":"2009","journal-title":"Proc 5th Ann Workshop Cyber Security and Information Intelligence Research Cyber Security and Information Challenges and Strategies (CSIIRW 09) ACM Press"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2010.5560200"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.19"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MILCOM.2009.5379966"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2060375"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859319"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687425"},{"key":"ref27","year":"1999","journal-title":"AMBA Specification (Rev 2 0)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.21"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"1170","DOI":"10.1109\/TIFS.2011.2136339","article-title":"An experimental analysis of power and delay signal-to-noise requirements for detecting Trojans and methods for achieving the required detection sensitivities","volume":"6","author":"chevalier-mames","year":"2011","journal-title":"IEEE Trans Inf Forensics Security"},{"key":"ref29","year":"0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2007.36"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559051"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513122"},{"key":"ref2","year":"2010","journal-title":"Integrity and Reliability of Integrated Circuits (IRIS)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559048"},{"key":"ref1","year":"2007","journal-title":"Trust for Integrated Circuits"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2316952"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1018130"},{"key":"ref21","year":"2011","journal-title":"International Technology Roadmap for Semiconductors 2011 Edition"},{"key":"ref24","first-page":"21","article-title":"Aging test strategy and adaptive test scheduling for SoC failure prediction","author":"h","year":"2010","journal-title":"Proc IEEE Int On-Line Testing Symp"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.38"},{"key":"ref26","first-page":"1","article-title":"Designing and implementing malicious hardware","author":"king","year":"2008","journal-title":"Proc of 1st Usenix Workshop on Large-Scale Exploits and Emergent Threats"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469571"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/7337501\/07150432.pdf?arnumber=7150432","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:46:46Z","timestamp":1642006006000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7150432\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":31,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2015.2447111","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,12]]}}}