{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T03:47:27Z","timestamp":1784000847162,"version":"3.55.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2016,9,1]],"date-time":"2016-09-01T00:00:00Z","timestamp":1472688000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/tr.2016.2570574","type":"journal-article","created":{"date-parts":[[2016,6,21]],"date-time":"2016-06-21T03:16:15Z","timestamp":1466478975000},"page":"1271-1283","source":"Crossref","is-referenced-by-count":20,"title":["Reliability and Maintenance Models for a Competing-Risk System Subjected to Random Usage"],"prefix":"10.1109","volume":"65","author":[{"given":"Kamyar","family":"Sabri-Laghaie","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rassoul","family":"Noorossana","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2009.06.008"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2005.03.009"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2005.05.017"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847264"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1017\/S0021900200005507"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.09.024"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2012.690930"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2011.03.014"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2010.491502"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1022"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2221016"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2013.812270"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299693"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/nav.10078"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.2307\/2346815"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009657101784"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.0002"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(98)00189-1"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929009"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1819"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2307\/1269661"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X13488479"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(02)00043-1"},{"key":"ref5","author":"nakagawa","year":"2007","journal-title":"Shock and Damage Models in Reliability Theory"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847278"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/qre.524"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1177010132"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2170253"},{"key":"ref1","volume":"4982","author":"nikulin","year":"2010","journal-title":"Advances in Degradation Modeling Applications to Reliability Survival Analysis and Finance"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/BF00985253"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009616111968"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-010-9157-x"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2004.829155"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1239\/aap\/1035228207"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X14565842"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1080\/07408179808966575"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/7556436\/07494632.pdf?arnumber=7494632","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:39:05Z","timestamp":1642005545000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7494632\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":36,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2016.2570574","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,9]]}}}