{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T15:39:27Z","timestamp":1773329967086,"version":"3.50.1"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Faculty Early Career Development","award":["CMMI-1351414"],"award-info":[{"award-number":["CMMI-1351414"]}]},{"name":"NSF","award":["CMMI-1538508"],"award-info":[{"award-number":["CMMI-1538508"]}]},{"name":"Department of Transportation through University Transportation Center Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/tr.2017.2746754","type":"journal-article","created":{"date-parts":[[2017,9,19]],"date-time":"2017-09-19T18:16:34Z","timestamp":1505844994000},"page":"53-65","source":"Crossref","is-referenced-by-count":38,"title":["Enabling Resilience of Complex Engineered Systems Using Control Theory"],"prefix":"10.1109","volume":"67","author":[{"given":"Nita","family":"Yodo","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2160-4917","authenticated-orcid":false,"given":"Pingfeng","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Melvin","family":"Rafi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","article-title":"Modeling of control systems","author":"roger chiu","year":"2014","journal-title":"Matlab Applications for the Practical Engineer"},{"key":"ref38","volume":"48","author":"hinrichsen","year":"2011","journal-title":"Mathematical Systems Theory I Modelling State Space Analysis Stability and Robustness"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1111\/risa.12093"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.12.009"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2011.09.002"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.2514\/6.2016-0474"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139163873"},{"key":"ref36","doi-asserted-by":"crossref","first-page":"559","DOI":"10.1109\/TCST.2005.847331","article-title":"PID control system analysis, design, and technology","volume":"13","author":"ang","year":"2005","journal-title":"IEEE Trans Control Syst Technol"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.strusafe.2011.12.004"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1061\/AJRUA6.0000826"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.2514\/6.2016-1625"},{"key":"ref40","author":"christiansen","year":"2005","journal-title":"Standard Handbook For Electrical Engineers"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2514\/6.2012-4444"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ITC.2013.6662939"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2514\/6.2010-946"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.2514\/6.2014-1042"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EPEPEMC.2016.7752115"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2016.7467983"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2016.2570820"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2015.2417170"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/60.391903"},{"key":"ref28","article-title":"RAG-The resilience analysis grid","author":"hollnagel","year":"2011","journal-title":"Resilience Engineering in Practice A Guidebook"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/37.969131"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1115\/1.4033990"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1115\/1.4032399"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847279"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.cor.2011.09.024"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1115\/1.4034223"},{"key":"ref8","first-page":"73","article-title":"Control theory","author":"simrock","year":"0","journal-title":"Proc CERN Accelerator School Digital Signal Process"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299651"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2104211"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2514\/6.2013-5209"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/427399a"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.5302\/J.ICROS.2011.17.11.1082"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1115\/DETC2014-35005"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2014.2363161"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.12.050"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.03.011"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2570542"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1115\/1.4034109"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1080\/09544828.2013.851783"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2521761"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/24\/8305671\/8046144-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8305671\/08046144.pdf?arnumber=8046144","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:56:02Z","timestamp":1649444162000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8046144\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":42,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2017.2746754","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,3]]}}}