{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,2]],"date-time":"2026-01-02T07:46:19Z","timestamp":1767339979122,"version":"3.37.3"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71601010"],"award-info":[{"award-number":["71601010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2016M590030"],"award-info":[{"award-number":["2016M590030"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/tr.2017.2765352","type":"journal-article","created":{"date-parts":[[2017,11,15]],"date-time":"2017-11-15T19:23:01Z","timestamp":1510773781000},"page":"118-128","source":"Crossref","is-referenced-by-count":15,"title":["A New Analytical Approach for Interval Availability Analysis of Markov Repairable Systems"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6128-3898","authenticated-orcid":false,"given":"Shijia","family":"Du","sequence":"first","affiliation":[]},{"given":"Enrico","family":"Zio","sequence":"additional","affiliation":[]},{"given":"Rui","family":"Kang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2007.03.029"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X16633036"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2010.551758"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2055915"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.mcm.2010.10.025"},{"key":"ref30","first-page":"186","article-title":"Availability of semi-Markov repairable systems with history-dependent up and down state","author":"zheng","year":"0","journal-title":"Proceedings of the 3rd Asian International Workshop"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-013-1402-8"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-012-1280-5"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2012.662309"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3969\/j.issn.1004-4132.2011.05.008"},{"journal-title":"An Introduction to the Basics of Reliability and Risk Analysis","year":"2017","author":"zio","key":"ref10"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2026816"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2285032"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2010.07.018"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.comcom.2012.08.007"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2013.02.009"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/12.75148"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1973.5215677"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/BF02187098"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/0377-2217(88)90007-0"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676765"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.874933"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1239\/jap\/1011994177"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1098\/rstb.1982.0156"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.06.014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299031"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1080\/15326340701645983"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2003.12.008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2570574"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.03.004"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2161703"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/16843703.2013.11673315"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2011.06.006"},{"key":"ref46","first-page":"165","article-title":"Certain theorems on two dimensional Laplace transform and on-homogeneous parabolic partial differential equations","volume":"6","author":"aghili","year":"2011","journal-title":"Surveys of Applied Mathematics"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.2307\/3214555"},{"key":"ref45","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1017\/S0269964806060013","article-title":"Numerical transform inversion using gaussian quadrature","volume":"20","author":"isegeriseger","year":"2006","journal-title":"Probab Eng Inf Sci"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1017\/S0269964800004976"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/12.364539"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2016.08.014"},{"key":"ref24","first-page":"479","article-title":"A new approach to analysis of availability","author":"kirmani","year":"0","journal-title":"Proc 2008 3rd Int Conf Availability Rel Secur"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2011.10.008"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0305-0548(03)00036-4"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.6028\/jres.081B.004"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177706444"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2418294"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1287\/ijoc.1120.0539"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8305671\/08110691.pdf?arnumber=8110691","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:21:59Z","timestamp":1642004519000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8110691\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":46,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2017.2765352","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"type":"print","value":"0018-9529"},{"type":"electronic","value":"1558-1721"}],"subject":[],"published":{"date-parts":[[2018,3]]}}}