{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T21:22:44Z","timestamp":1776720164915,"version":"3.51.2"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71601138"],"award-info":[{"award-number":["71601138"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Sembcorp NUS Corporate Lab Project","award":["R-261-513-003-281"],"award-info":[{"award-number":["R-261-513-003-281"]}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"crossref","award":["201506230136"],"award-info":[{"award-number":["201506230136"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001381","name":"National Research Foundation of Singapore","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100001381","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/tr.2017.2778283","type":"journal-article","created":{"date-parts":[[2017,12,25]],"date-time":"2017-12-25T21:37:42Z","timestamp":1514237862000},"page":"401-413","source":"Crossref","is-referenced-by-count":120,"title":["Optimal Inspection and Replacement Policies for Multi-Unit Systems Subject to Degradation"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7103-1387","authenticated-orcid":false,"given":"Qiuzhuang","family":"Sun","sequence":"first","affiliation":[]},{"given":"Zhi-Sheng","family":"Ye","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2495-5234","authenticated-orcid":false,"given":"Nan","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","author":"puterman","year":"2014","journal-title":"Markov Decision Processes Discrete Stochastic Dynamic Programming"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898719062"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2015.11.008"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(98)00189-1"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2007.12.012"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.12.011"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(01)00197-7"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2011.649388"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(02)00204-1"},{"key":"ref34","author":"kuo","year":"2003","journal-title":"Optimal Reliability Modeling Principles and Applications"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2791616"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2005.03.012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.853278"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2684821"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.10.015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2012.690930"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2014.11.029"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847264"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.08.011"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2005.05.017"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(00)00093-4"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2337791"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2015.2389757"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2004.04.013"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.816402"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(02)00238-7"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.02.029"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.08.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/asmb.2063"},{"key":"ref7","first-page":"1461","article-title":"When is acceleration unnecessary in a degradation test?","volume":"27","author":"hong","year":"2017","journal-title":"Statistica Sinica"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2454507"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2284733"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2020103"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2182818"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1017\/S0021900200019926"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.06.018"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2011.2162499"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1239\/jap\/1158784949"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2010.12.023"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2046798"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8305671\/08239671.pdf?arnumber=8239671","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:21:58Z","timestamp":1642004518000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8239671\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":40,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2017.2778283","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,3]]}}}