{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,7]],"date-time":"2026-02-07T08:48:17Z","timestamp":1770454097149,"version":"3.49.0"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T00:00:00Z","timestamp":1527811200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Ordered and Spatial Data Center of Excellence"},{"DOI":"10.13039\/501100003121","name":"Ferdowsi University of Mashhad","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100003121","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/tr.2018.2801474","type":"journal-article","created":{"date-parts":[[2018,3,19]],"date-time":"2018-03-19T22:06:26Z","timestamp":1521497186000},"page":"678-687","source":"Crossref","is-referenced-by-count":13,"title":["On Reliability Analysis of <inline-formula>\n                     <tex-math notation=\"LaTeX\">$k$<\/tex-math>\n                  <\/inline-formula> -Out-of-<inline-formula>\n                     <tex-math notation=\"LaTeX\">$n$<\/tex-math>\n                  <\/inline-formula>:<inline-formula> \n                     <tex-math notation=\"LaTeX\">$F$<\/tex-math>\n                  <\/inline-formula> Systems Equipped With a Single Cold Standby Component Under Degradation Performance"],"prefix":"10.1109","volume":"67","author":[{"given":"Ensiyeh","family":"Nezakati","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6661-2822","authenticated-orcid":false,"given":"Mostafa","family":"Razmkhah","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.06.020"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"471","DOI":"10.1080\/07408170108936846","article-title":"Cold standby redundancy optimization for nonrepairable systems","volume":"33","author":"coit","year":"2001","journal-title":"IIE Trans"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2192587"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2012.05.012"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00184-013-0441-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2014.12.029"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/03081079.2015.1028541"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177698125"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-013-9245-9"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1975.5215123"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/02664760903055434"},{"key":"ref27","article-title":"Development of standard\n methods of testing and analyzing fatigue crack growth rate data","author":"hudak","year":"1978"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/qre.710"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-015-9339-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2430451"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.874934"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/asmb.2129"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/qre.4680110208"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.spl.2007.09.054"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.2307\/1269661"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009629311100"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-005-5237-8"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1023\/B:LIDA.0000036389.14073.dd"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539315500308"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2012.700749"},{"key":"ref26","author":"casella","year":"2002","journal-title":"Statistical Inference"},{"key":"ref25","author":"pawitan","year":"2013","journal-title":"In All Likelihood Statistical Modelling and Inference Using Likelihood"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8370165\/08318933.pdf?arnumber=8318933","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T07:22:14Z","timestamp":1643181734000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8318933\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":27,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tr.2018.2801474","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,6]]}}}