{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T11:23:23Z","timestamp":1774524203013,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2018,9,1]],"date-time":"2018-09-01T00:00:00Z","timestamp":1535760000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["51605487"],"award-info":[{"award-number":["51605487"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100007129","name":"Natural Science Foundation of Shandong Province","doi-asserted-by":"crossref","award":["ZR2016FQ03"],"award-info":[{"award-number":["ZR2016FQ03"]}],"id":[{"id":"10.13039\/501100007129","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100002858","name":"Postdoctoral Science Foundation of China","doi-asserted-by":"crossref","award":["2016M592965"],"award-info":[{"award-number":["2016M592965"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/tr.2018.2828605","type":"journal-article","created":{"date-parts":[[2018,5,24]],"date-time":"2018-05-24T19:06:57Z","timestamp":1527188817000},"page":"1008-1018","source":"Crossref","is-referenced-by-count":27,"title":["Design an Optimal Accelerated-Stress Reliability Acceptance Test Plan Based on Acceleration Factor"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1058-3900","authenticated-orcid":false,"given":"Hao-Wei","family":"Wang","sequence":"first","affiliation":[]},{"given":"Ke-Nan","family":"Teng","sequence":"additional","affiliation":[]},{"given":"Yuan","family":"Zhou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1961"},{"key":"ref32","first-page":"55","article-title":"Study on\n accelerated factor and condition for constant failure mechanism","volume":"18","author":"zhou","year":"1996","journal-title":"Syst Eng Electron"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.05.039"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2087430"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X14552312"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1214\/088342306000000321"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009664101413"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2033734"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2575442"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.0001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2170115"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2410191"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2315938"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2008.12.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2014.12.015"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2337071"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194351"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2683533"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2004.06.030"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2696341"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.863811"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.05.018"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2257055"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/02664760903406488"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/e17052556"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2014.09.003"},{"key":"ref2","first-page":"19","article-title":"Designing an optimum acceptance plan using Bayesian inference and stochastic\n dynamic programming","volume":"16","author":"niaki","year":"2009","journal-title":"Sci Iranica"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1994.10485803"},{"key":"ref1","author":"nelson","year":"2004","journal-title":"Accelerated Testing Statistical Models Test Plans and Data Analysis"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2011.06.008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.830074"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.08197"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.879077"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.06.005"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2315773"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2513038"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8452065\/08365081.pdf?arnumber=8365081","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T14:46:12Z","timestamp":1643208372000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8365081\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":36,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2018.2828605","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,9]]}}}