{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T19:41:00Z","timestamp":1776282060876,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2018,9,1]],"date-time":"2018-09-01T00:00:00Z","timestamp":1535760000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/tr.2018.2829081","type":"journal-article","created":{"date-parts":[[2018,5,23]],"date-time":"2018-05-23T18:44:50Z","timestamp":1527101090000},"page":"1249-1260","source":"Crossref","is-referenced-by-count":18,"title":["A Diameter-Constrained Approximation Algorithm of Multistate Two-Terminal Reliability"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5795-9771","authenticated-orcid":false,"given":"Zuyuan","family":"Zhang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1196-6324","authenticated-orcid":false,"given":"Fangming","family":"Shao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2017.1351044"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2011854"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2220897"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/S0360-8352(98)00111-9"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1364\/OE.9.000400"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2591504"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.920792"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.05.032"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11518-017-5343-7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.11.010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2005.11.006"},{"key":"ref15","first-page":"1","article-title":"An improved d-MP search algorithm for multi-state networks","author":"bai","year":"0","journal-title":"Proc Rel Maintainability Symp"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2015.10.004"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jocs.2016.05.011"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-005-0287-3"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.06.012"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/BF01386390"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0270-0255(87)90568-9"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1137\/0201010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2013.02.016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1986.4335431"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"77","DOI":"10.1007\/s001700200127","article-title":"A simple method to verify all d-minimal path candidates of a limited-flow network and its reliability","volume":"20","author":"yeh","year":"2002","journal-title":"Int J Adv Manuf Technol"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.1958.6372698"},{"key":"ref8","first-page":"26","article-title":"Efficient evaluation of a diameter-constrained reliability measure of some families of graphs","volume":"64","author":"petingi","year":"2013","journal-title":"Graph Theory Notes of New York"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.camwa.2010.09.033"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.05.011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.dam.2006.03.029"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1002\/9780470316900","author":"rausand","year":"1994","journal-title":"System reliability theory Models statistical methods and applications"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"1600","DOI":"10.1109\/TSMCB.2011.2157911","article-title":"A greedy algorithm for faster feasibility evaluation of all-terminal-reliable networks","volume":"41","author":"won","year":"2011","journal-title":"IEEE Trans Syst Man Cybern B Cybern"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2004.05.002"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2014.04.035"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.08.026"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.916871"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/net.3230250306"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2003.814666"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8452065\/08362997.pdf?arnumber=8362997","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,24]],"date-time":"2022-08-24T02:03:08Z","timestamp":1661306588000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8362997\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":35,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2018.2829081","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,9]]}}}