{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T17:41:01Z","timestamp":1775842861511,"version":"3.50.1"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2018,9,1]],"date-time":"2018-09-01T00:00:00Z","timestamp":1535760000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Brazilian Institutions: CNPq, CAPES, and FAPESP"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/tr.2018.2829721","type":"journal-article","created":{"date-parts":[[2018,6,21]],"date-time":"2018-06-21T20:22:50Z","timestamp":1529612570000},"page":"1030-1042","source":"Crossref","is-referenced-by-count":46,"title":["The Inverse Nakagami-m Distribution: A Novel Approach in Reliability"],"prefix":"10.1109","volume":"67","author":[{"given":"Francisco","family":"Louzada","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5387-2457","authenticated-orcid":false,"given":"Pedro Luiz","family":"Ramos","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3406-4518","authenticated-orcid":false,"given":"Diego","family":"Nascimento","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2338251"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2354192"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1968.tb00724.x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2008.926148"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/22721.23109"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1980.10477530"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/15326349508807340"},{"key":"ref17","doi-asserted-by":"crossref","DOI":"10.1201\/b17229","author":"migon","year":"2014","journal-title":"Statistical Inference An Integrated Approach"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1987.tb01422.x"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/0167-7152(94)90100-7"},{"key":"ref4","first-page":"69","article-title":"Use of\n Nakagami distribution and logarithmic compression in ultrasonic tissue characterization","volume":"26","author":"tsui","year":"2006","journal-title":"Medical & Biological Engineering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/58.911740"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1785\/0120100030"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)HE.1943-5584.0000220"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9574.1991.tb01312.x"},{"key":"ref7","volume":"2","author":"johnson","year":"1970","journal-title":"Distributions in Statistics Continuous Univariate Distributions"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2012.071612.111838"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299691"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-08-009306-2.50005-4"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/00949655.2011.615316"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/02331888.2017.1327532"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2016.2603530"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2011.06.019"},{"key":"ref23","article-title":"Survival\n analysis with change point hazard functions","author":"goodman","year":"2006","journal-title":"Harvard University Biostatistics Working Paper Series"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2011.07.015"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1080\/02664763.2010.505948"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8452065\/08374971.pdf?arnumber=8374971","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T16:54:41Z","timestamp":1643216081000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8374971\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":26,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2018.2829721","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,9]]}}}