{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T13:53:36Z","timestamp":1773842016662,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61573043"],"award-info":[{"award-number":["61573043"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71671009"],"award-info":[{"award-number":["71671009"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71601010"],"award-info":[{"award-number":["71601010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","award":["201606020082"],"award-info":[{"award-number":["201606020082"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/tr.2018.2874459","type":"journal-article","created":{"date-parts":[[2018,11,12]],"date-time":"2018-11-12T23:19:42Z","timestamp":1542064782000},"page":"317-329","source":"Crossref","is-referenced-by-count":35,"title":["A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7713-7625","authenticated-orcid":false,"given":"Mengfei","family":"Fan","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4937-4380","authenticated-orcid":false,"given":"Zhiguo","family":"Zeng","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7108-637X","authenticated-orcid":false,"given":"Enrico","family":"Zio","sequence":"additional","affiliation":[]},{"given":"Rui","family":"Kang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6527-4251","authenticated-orcid":false,"given":"Ying","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2017.1342056"},{"key":"ref38","article-title":"Milling data set","author":"agogino","year":"2007"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2013.01.010"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3437-9_10"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/78.978374"},{"key":"ref30","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-77950-8","author":"hamada","year":"2008","journal-title":"Bayesian Reliability"},{"key":"ref37","doi-asserted-by":"crossref","DOI":"10.1201\/9781420065220","author":"baclawski","year":"2008","journal-title":"Introduction to Probability with R"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1015346317"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1080\/02331880309257"},{"key":"ref34","article-title":"A prognostic approach based on particle filtering and optimized tuning kernel smoothing","author":"hu","year":"0","journal-title":"Proc 2nd Eur Conf Prognostics Health Manage Soc"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2354874"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.06.020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2014.955152"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1023\/B:LIDA.0000019256.59372.63"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1239\/jap\/1014842555"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2103710"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2011.10.025"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2010.12.018"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.09.024"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.05.004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.05.047"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1080\/0740817X.2010.491502","article-title":"Reliability and maintenance modeling for systems subject to multiple dependent competing failure processes","volume":"43","author":"peng","year":"2011","journal-title":"IIE Trans"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X17706654"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.12.013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2170254"},{"key":"ref29","doi-asserted-by":"crossref","DOI":"10.1093\/oso\/9780198572237.001.0001","author":"grimmett","year":"2001","journal-title":"Probability and Random Processes"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2167779"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2013.812270"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2221016"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847278"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.10.006"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2016.08.014"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0172680"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s100605774"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2017.05.009"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.12.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X15573046"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2684821"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/8656610\/08531775.pdf?arnumber=8531775","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,12]],"date-time":"2024-07-12T09:11:31Z","timestamp":1720775491000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8531775\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":39,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2018.2874459","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,3]]}}}