{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T13:30:59Z","timestamp":1780407059446,"version":"3.54.1"},"reference-count":58,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/100007195","name":"Universit\u00e0 degli Studi di Napoli Federico II","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007195","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007388","name":"Compagnia di San Paolo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007388","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003816","name":"Huawei Technologies","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003816","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/tr.2019.2954384","type":"journal-article","created":{"date-parts":[[2019,12,3]],"date-time":"2019-12-03T20:44:41Z","timestamp":1575405881000},"page":"346-361","source":"Crossref","is-referenced-by-count":13,"title":["Dependability Assessment of the Android OS Through Fault Injection"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7103-592X","authenticated-orcid":false,"given":"Domenico","family":"Cotroneo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9358-7100","authenticated-orcid":false,"given":"Antonio Ken","family":"Iannillo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1084-4824","authenticated-orcid":false,"given":"Roberto","family":"Natella","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7168-015X","authenticated-orcid":false,"given":"Stefano","family":"Rosiello","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","article-title":"UI\/Application exerciser Monkey","year":"0"},{"key":"ref38","article-title":"Dependability assessment of android OS","author":"iannillo","year":"2018"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2009.5270313"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/52.595959"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2610418"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/EDCC.2006.16"},{"key":"ref37","first-page":"1","article-title":"The Ballista software robustness testing service","author":"devale","year":"0","journal-title":"Proc Testing Comput Softw Conf"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/1950365.1950401"},{"key":"ref35","first-page":"1","article-title":"Windows XP kernel crash analysis","author":"ganapathi","year":"0","journal-title":"Proc USENIX Large Install Syst Administration Conf"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.21236\/ADA419594"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/12.811108"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2016.2522968"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2002.1185618"},{"key":"ref2","author":"tanenbaum","year":"2014","journal-title":"Modern Operating Systems"},{"key":"ref1","article-title":"World quality report","year":"2017"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/12.54853"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1993.627311"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/102792.102801"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.2"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/32.601075"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/EDCC.2012.12"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2016.22"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1145\/2491411.2491450"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635896"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.67"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311898"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2002.1185639"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1145\/2639108.2639131"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1145\/2652483"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1145\/2771783.2771786"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.242"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2017.27"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2012.6224269"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2016.25"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/2.585157"},{"key":"ref13","author":"voas","year":"1997","journal-title":"Software Fault Injection Inoculating Programs Against Errors"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2841425"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1996.534615"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.113"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2018.2850755"},{"key":"ref18","first-page":"239","article-title":"FATE and DESTINI: A framework for cloud recovery testing","author":"gunawi","year":"0","journal-title":"Proc 8th USENIX Symp Netw Syst Des Implementation"},{"key":"ref19","author":"yaghmour","year":"2013","journal-title":"Embedded Android Porting Extending and Customizing"},{"key":"ref4","article-title":"Mobile OS market share 2018","year":"2018"},{"key":"ref3","article-title":"Keeping your app responsive","year":"0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516728"},{"key":"ref5","article-title":"Android open source project","year":"0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2017.16"},{"key":"ref49","article-title":"BinderCracker: Assessing the robustness of android system services","author":"feng","year":"2016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2766498.2766519"},{"key":"ref9","first-page":"249","article-title":"Characterizing failures in mobile OSes: A case study with Android and Symbian","author":"maji","year":"0","journal-title":"Proc IEEE 21st Int Symp Softw Rel Eng"},{"key":"ref46","article-title":"Fuzzing the Phone in your Phone","author":"mulliner","year":"2009","journal-title":"Black Hat USA"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1145\/2714576.2714607"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/2632168.2632169"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/2536853.2536881"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1145\/2810103.2813606"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-30436-1_2"},{"key":"ref44","author":"miller","year":"2012","journal-title":"IOS Hacker's Handbook"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2881306"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9367048\/08920220.pdf?arnumber=8920220","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:05:18Z","timestamp":1642003518000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8920220\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":58,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2019.2954384","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,3]]}}}