{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,4]],"date-time":"2026-09-04T18:09:35Z","timestamp":1788545375250,"version":"build-2803163510"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100014440","name":"Ministerio de Ciencia, Innovación y Universidades","doi-asserted-by":"publisher","award":["PGC2018-095194-B-I00"],"award-info":[{"award-number":["PGC2018-095194-B-I00"]}],"id":[{"id":"10.13039\/100014440","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100014440","name":"Ministerio de Ciencia, Innovación y Universidades","doi-asserted-by":"publisher","award":["FPU16\/03104"],"award-info":[{"award-number":["FPU16\/03104"]}],"id":[{"id":"10.13039\/100014440","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/tr.2019.2954385","type":"journal-article","created":{"date-parts":[[2019,12,4]],"date-time":"2019-12-04T17:49:53Z","timestamp":1575481793000},"page":"937-953","source":"Crossref","is-referenced-by-count":35,"title":["Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5842-8892","authenticated-orcid":false,"given":"Narayanaswamy","family":"Balakrishnan","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9626-6449","authenticated-orcid":false,"given":"Elena","family":"Castilla","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4766-1909","authenticated-orcid":false,"given":"Nirian","family":"Martin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2005-8245","authenticated-orcid":false,"given":"Leandro","family":"Pardo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2016.01.004"},{"key":"ref11","author":"hampel","year":"1986","journal-title":"Robust Statistics The Approach Based on Influence Functions"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/bimj.4710360505"},{"key":"ref13","first-page":"453","article-title":"Automatic selection of the tuning parameter in the minimum density power divergence estimation","volume":"30","author":"hong","year":"2001","journal-title":"Journal of the Korean Statistical Society"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.2307\/2529978"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.2307\/1269547"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/24.9876"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.2307\/1269200"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1998.10485191"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9473(01)00091-3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s00184-019-00718-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2019.2903244"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s00184-018-0653-4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/02331888.2015.1016435"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1214\/13-EJS847"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1080\/00949650802142592"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2257054"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2208301"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/02664763.2015.1016901"},{"key":"ref20","author":"pardo","year":"2006","journal-title":"Statistical Inference Based on Divergence Measures"},{"key":"ref22","article-title":"Selecting tuning parameters in minimum distance estimators","author":"warwick","year":"2001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2013.733611"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1959.10489862"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/00949650412331299120"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9181670\/08922869.pdf?arnumber=8922869","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T09:43:03Z","timestamp":1651052583000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8922869\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":24,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2019.2954385","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,9]]}}}