{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,5]],"date-time":"2026-03-05T17:58:59Z","timestamp":1772733539278,"version":"3.50.1"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71771051"],"award-info":[{"award-number":["71771051"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific Research Foundation of Graduate School of Southeast University","award":["YBPY1876"],"award-info":[{"award-number":["YBPY1876"]}]},{"DOI":"10.13039\/100010449","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100010449","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Humanities and Social Sciences","award":["19YJC630160"],"award-info":[{"award-number":["19YJC630160"]}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","award":["201906090177"],"award-info":[{"award-number":["201906090177"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/tr.2019.2955500","type":"journal-article","created":{"date-parts":[[2019,12,13]],"date-time":"2019-12-13T21:00:28Z","timestamp":1576270828000},"page":"954-967","source":"Crossref","is-referenced-by-count":46,"title":["Failure Mode and Effect Analysis for Machine Tool Risk Analysis Using Extended Gained and Lost Dominance Score Method"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2000-5514","authenticated-orcid":false,"given":"Wei-Zhong","family":"Wang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8230-8380","authenticated-orcid":false,"given":"Xin-Wang","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Shu-Li","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2017.1407007"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.3233\/IFS-131095"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICINFA.2010.5512403"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-016-2118-x"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.oceaneng.2013.12.015"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssci.2016.10.006"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s10726-014-9385-7"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.wasman.2015.11.030"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/MESA.2016.7587194"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.17973\/MMSJ.2016_12_2016204"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2016.01.007"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1080\/18756891.2016.1146530"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2018.1448089"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssci.2018.08.009"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2869787"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2778316"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/etep.1647"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2754642"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2018.2861719"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-014-0880-0"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/int.20340"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2018.07.012"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-005-0483-y"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2018.05.030"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.03.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2570567"},{"key":"ref29","first-page":"1","article-title":"Failure mode and effect analysis with extended grey relational analysis method in cloud setting","volume":"30","author":"liu","year":"2017","journal-title":"Total Quality Management & Business Excellence"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2018.08.019"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssci.2017.10.018"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.06.014"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2017.07.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssci.2017.06.009"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.11.018"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2014.999732"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2018.07.044"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2016.2560521"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.5802\/aif.53"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2878784"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/S0166-218X(00)00264-X"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2018.1539889"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/s12559-017-9493-1"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.2991\/ijcis.2017.10.1.67"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-17594"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-181007"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2014.02.130"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2018.02.077"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9181670\/08932606.pdf?arnumber=8932606","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:43:03Z","timestamp":1651066983000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8932606\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":46,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2019.2955500","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,9]]}}}