{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T07:14:30Z","timestamp":1790406870365,"version":"4.1.0"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Kansas NASA EPSCoR Research Infrastructure Development Program","award":["80NSSC19M0042"],"award-info":[{"award-number":["80NSSC19M0042"]}]},{"DOI":"10.13039\/100006770","name":"American Chemical Society Petroleum Research Fund","doi-asserted-by":"publisher","award":["PRF-59716-DNI10"],"award-info":[{"award-number":["PRF-59716-DNI10"]}],"id":[{"id":"10.13039\/100006770","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2020,12]]},"DOI":"10.1109\/tr.2020.2997404","type":"journal-article","created":{"date-parts":[[2020,6,16]],"date-time":"2020-06-16T20:56:07Z","timestamp":1592340967000},"page":"1254-1266","source":"Crossref","is-referenced-by-count":25,"title":["Accelerated Degradation Testing With Long-Term Memory Effects"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3450-3987","authenticated-orcid":false,"given":"Wujun","family":"Si","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2686-9818","authenticated-orcid":false,"given":"Yunfei","family":"Shao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wei","family":"Wei","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-004-4775-9"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1137\/1135065"},{"key":"ref33","doi-asserted-by":"crossref","DOI":"10.1093\/oso\/9780199257294.001.0001","author":"robinson","year":"2003","journal-title":"Time Series With Long Memory"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/24.784273"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2883983"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2315773"},{"key":"ref37","first-page":"5","author":"taqqu","year":"2003","journal-title":"Theory and Applications of Long-Range Dependence"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-35512-7"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/68.1.165"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1137\/1010093"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-005-5237-8"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2014.09.003"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2337071"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1214\/088342306000000321"},{"key":"ref1","author":"nelson","year":"2009","journal-title":"Accelerated Testing Statistical Models Test Plans and Data Analysis"},{"key":"ref20","first-page":"1354","article-title":"Sequence variability and long-range dependence in DNA: An information theoretic perspective","author":"krishnamachari","year":"2004","journal-title":"Proc Int Conf Neural Inf Process"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1998.10485191"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MIC.2004.46"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCP.1965.1135088"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-5194-4_12"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0143-8174(84)90032-5"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2017.2751218"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2195"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2717488"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9892.1988.tb00465.x"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2896230"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2720752"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2877643"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.12.017"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2016.7542847"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2813964"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s007800050049"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s10712-012-9217-8"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.0016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2015.1078525"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/nav.20163"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2703646"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.765324"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2013.11.023"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/996986505"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.853441"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1029\/WR020i012p01898"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1017\/S0269964803173081"},{"key":"ref48","author":"casella","year":"1990","journal-title":"Statistical Inference"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/7.4.308"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/49.400651"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.bpj.2012.09.040"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.2307\/1390903"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-4149(00)00078-8"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9274445\/09119200.pdf?arnumber=9119200","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,7]],"date-time":"2024-08-07T19:44:49Z","timestamp":1723059889000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9119200\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12]]},"references-count":49,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2020.2997404","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,12]]}}}