{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T14:02:15Z","timestamp":1775311335294,"version":"3.50.1"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61772263"],"award-info":[{"award-number":["61772263"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61772014"],"award-info":[{"award-number":["61772014"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Collaborative Innovation Center of Novel Software Technology and Industrialization"},{"DOI":"10.13039\/501100012246","name":"Priority Academic Program Development of Jiangsu Higher Education Institutions","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012246","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2021,6]]},"DOI":"10.1109\/tr.2020.3047396","type":"journal-article","created":{"date-parts":[[2021,2,25]],"date-time":"2021-02-25T19:11:26Z","timestamp":1614280286000},"page":"711-727","source":"Crossref","is-referenced-by-count":115,"title":["Software Defect Prediction Based on Gated Hierarchical LSTMs"],"prefix":"10.1109","volume":"70","author":[{"given":"Hao","family":"Wang","sequence":"first","affiliation":[]},{"given":"Weiyuan","family":"Zhuang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8667-0456","authenticated-orcid":false,"given":"Xiaofang","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"284?292","article-title":"Use of relative code churn measures to predict system defect density","author":"nagappan","year":"0","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.25"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2010.18"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2931051"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/2950290.2950353"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-018-9661-2"},{"key":"ref37","first-page":"45?52","article-title":"Convolutional neural networks over control flow graphs for software defect prediction","author":"phan","year":"0","journal-title":"Proc IEEE Int Conf Tools Artif Intell"},{"key":"ref36","first-page":"69?81","article-title":"Using object-oriented design metrics to predict software defects, models and methods of system dependability","author":"jureczko","year":"2010"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1868328.1868342"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1995.tb02031.x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3290353"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.07.040"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.24963\/ijcai.2017\/423"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/390013.808479"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC48747.2019.00041"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2017.42"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1162\/neco.2006.18.7.1527"},{"key":"ref16","first-page":"3111?3119","article-title":"Distributed representations of words and phrases and their compositionality","author":"mikolov","year":"0","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3115\/v1\/D14-1162"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1997.9.8.1735"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2925313"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME.2017.51"},{"key":"ref4","article-title":"Elements of Software Science (Operating and Programming Systems Series).","author":"maurice","year":"1977"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.256941"},{"key":"ref3","article-title":"Survey on software defect prediction","author":"nam","year":"2014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2018.2877612"},{"key":"ref29","first-page":"757?773","article-title":"A large-scale empirical study of just-in-time quality assurance","volume":"39","author":"kamei","year":"2012","journal-title":"IEEE Trans Softw Eng"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.3001918"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3183339"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2013.6693087"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2889160.2889165"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2008.10.027"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2018.8330212"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2007.28"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2019.03.012"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194018400259"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2008.12.001"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2568225.2568320"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.09.002"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2013.20"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2015.14"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-008-9079-3"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-014-9346-4"},{"key":"ref25","article-title":"Do different cross-project defect prediction methods identify the same defective modules?","volume":"32","author":"chen","year":"2020","journal-title":"Journal of Software: Evolution and Process"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9448244\/09326336.pdf?arnumber=9326336","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T20:27:46Z","timestamp":1635280066000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9326336\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6]]},"references-count":45,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tr.2020.3047396","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,6]]}}}