{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T18:18:41Z","timestamp":1773944321142,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51875359"],"award-info":[{"award-number":["51875359"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51975355"],"award-info":[{"award-number":["51975355"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","award":["20ZR1428600"],"award-info":[{"award-number":["20ZR1428600"]}],"id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Ministry of Education-China Mobile Research Foundation","award":["CMHQ-JS-201900003"],"award-info":[{"award-number":["CMHQ-JS-201900003"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2022,9]]},"DOI":"10.1109\/tr.2021.3074506","type":"journal-article","created":{"date-parts":[[2021,5,11]],"date-time":"2021-05-11T19:57:11Z","timestamp":1620763031000},"page":"1340-1354","source":"Crossref","is-referenced-by-count":22,"title":["Progressive Opportunistic Maintenance Policies for Service-Outsourcing Network With Prognostic Updating and Dynamical Optimization"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9121-1716","authenticated-orcid":false,"given":"Tangbin","family":"Xia","sequence":"first","affiliation":[{"name":"Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, SJTU-Fraunhofer Center, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1904-536X","authenticated-orcid":false,"given":"Guojin","family":"Si","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering &amp; Management, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4872-4860","authenticated-orcid":false,"given":"Dong","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, SJTU-Fraunhofer Center, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6026-9755","authenticated-orcid":false,"given":"Ershun","family":"Pan","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering &amp; Management, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7241-4371","authenticated-orcid":false,"given":"Lifeng","family":"Xi","sequence":"additional","affiliation":[{"name":"Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, SJTU-Fraunhofer Center, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2166779"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1051\/mfreview\/2016005"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2196171"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.11.013"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1115\/1.4043255"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2005.01.049"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2005.07.005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2010.08.144"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1287\/opre.1090.0788"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106519"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2913331"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2487578"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2004.840433"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2955596"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.08.013"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929018"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1287\/opre.1110.0912"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2006.876609"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1115\/1.4035962"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.09.005"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2008.12.014"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2013.05.021"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2018.02.002"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2017.07.008"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2015.03.023"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.09.016"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2018.05.001"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.12.031"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2019.1647478"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2012.03.027"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9872066\/09428030.pdf?arnumber=9428030","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T23:54:00Z","timestamp":1704844440000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9428030\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9]]},"references-count":30,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2021.3074506","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,9]]}}}