{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T18:01:23Z","timestamp":1777658483862,"version":"3.51.4"},"reference-count":58,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"University SAL Labs initiative"},{"DOI":"10.13039\/100018461","name":"Silicon Austria Labs","doi-asserted-by":"crossref","id":[{"id":"10.13039\/100018461","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Austrian partner universities"},{"name":"Singapore National Research Foundation SOCure","award":["NRF2018NCR-NCR002-0001"],"award-info":[{"award-number":["NRF2018NCR-NCR002-0001"]}]},{"name":"European Unions Horizon 2020 Research and Innovation Programme"},{"name":"Programme SASPRO 2 COFUND Marie Sklodowska-Curie","award":["945478"],"award-info":[{"award-number":["945478"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/tr.2021.3105697","type":"journal-article","created":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T20:23:51Z","timestamp":1630959831000},"page":"1527-1539","source":"Crossref","is-referenced-by-count":40,"title":["SNIFF: Reverse Engineering of Neural Networks With Fault Attacks"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7844-5267","authenticated-orcid":false,"given":"Jakub","family":"Breier","sequence":"first","affiliation":[{"name":"Silicon Austria Labs, TU-Graz SAL DES Lab, Graz University of Technology, Graz, Austria"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3149-9401","authenticated-orcid":false,"given":"Dirmanto","family":"Jap","sequence":"additional","affiliation":[{"name":"Temasek Laboratories, Nanyang Technological University, Singapore, Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4512-6921","authenticated-orcid":false,"given":"Xiaolu","family":"Hou","sequence":"additional","affiliation":[{"name":"Faculty of Informatics and Information Technologies, Slovak University of Technology, Bratislava, Slovakia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6903-5127","authenticated-orcid":false,"given":"Shivam","family":"Bhasin","sequence":"additional","affiliation":[{"name":"Temasek Laboratories, Nanyang Technological University, Singapore, Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7300-9215","authenticated-orcid":false,"given":"Yang","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Computer Science and Engineering, Nanyang Technological University, Singapore, Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.195"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.243"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3025022"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.308"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref30","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"0","journal-title":"Conf Track Proc ICLR"},{"key":"ref37","first-page":"1","article-title":"Wide residual networks","author":"zagoruyko","year":"0","journal-title":"Proc Brit Mach Vis Conf"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v31i1.11231"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref34","first-page":"235","author":"agoyan","year":"0","journal-title":"Proc IEEE 16th Int On-Line Testing Symp"},{"key":"ref28","article-title":"Learning multiple layers of features from tiny images","author":"krizhevsky","year":"2009"},{"key":"ref27","first-page":"8024","article-title":"Pytorch: An imperative style, high-performance deep learning library","author":"paszke","year":"0","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2018.00038"},{"key":"ref1","first-page":"601","article-title":"Stealing machine learning models via prediction APIs","author":"tram\u00e8r","year":"0","journal-title":"Proc USENIX Conf Secur Symp"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01321"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2742698"},{"key":"ref21","article-title":"Targeted attack against deep neural networks via flipping limited weight bits","author":"bai","year":"0","journal-title":"Proc Int Conf Learn Representations"},{"key":"ref24","article-title":"A simple explanation for the existence of adversarial examples with small hamming distance","author":"shamir","year":"2019"},{"key":"ref23","first-page":"1281","article-title":"With great training comes great vulnerability: Practical attacks against transfer learning","author":"wang","year":"0","journal-title":"Proc Usenix Secur Symp"},{"key":"ref26","article-title":"Keras","author":"chollet","year":"2015"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2017.41"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-017-0006-1"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-69453-5_13"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-11333-9"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2869142"},{"key":"ref56","article-title":"Resiliency of deep neural networks under quantization","author":"sung","year":"2015"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS.2014.6986082"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-11333-9_9"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1145\/1873548.1873555"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810751"},{"key":"ref10","first-page":"1445","article-title":"VOLTpwn: Attacking x86 processor integrity from software","author":"kenjar","year":"0","journal-title":"Proc 29th USENIX Secur Symp"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-66787-4_9"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.634"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SIOT.2015.15"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203770"},{"key":"ref14","article-title":"Qualitatively characterizing neural network optimization problems","author":"goodfellow","year":"0","journal-title":"Conf Track Proc 3rd Int Conf Learn Representations"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA49335.2020.9261013"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2021.114116"},{"key":"ref17","first-page":"497","article-title":"Terminal brain damage: Exposing the graceless degradation in deep neural networks under hardware fault attacks","author":"hong","year":"0","journal-title":"Proc 28th USENIX Security Symp ( USENIX Security 19)"},{"key":"ref18","first-page":"1463","article-title":"Deephammer: Depleting the intelligence of deep neural networks through targeted chain of bit flips","author":"yao","year":"0","journal-title":"Proc 29th USENIX Secur Symp"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00130"},{"key":"ref4","first-page":"515","article-title":"CSI NN: Reverse engineering of neural network architectures through electromagnetic side channel","author":"batina","year":"0","journal-title":"Proc USENIX Conf Secur Symp"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0052259"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2878387"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3243734.3278519"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-16763-3_15"},{"key":"ref7","first-page":"1345","article-title":"High accuracy and high fidelity extraction of neural networks","author":"jagielski","year":"0","journal-title":"Proc USENIX Conf Secur Symp"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2019.2897663"},{"key":"ref9","article-title":"Exploiting the DRAM rowhammer bug to gain Kernel privileges","volume":"15","author":"seaborn","year":"2015","journal-title":"Black Hat"},{"key":"ref46","first-page":"1","article-title":"Efficiency of a glitch detector against electromagnetic fault injection","author":"zussa","year":"0","journal-title":"Proc Conf Des Autom Test Europe Eur Des Autom Assoc"},{"key":"ref45","first-page":"102","article-title":"Ring oscillator under laser: Potential of PLL-based countermeasure against laser fault injection","author":"he","year":"0","journal-title":"Fault Diagnosis and Tolerance in Cryptography"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45238-6_10"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2018.00118"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1145\/1081870.1081950"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00907"},{"key":"ref44","doi-asserted-by":"crossref","first-page":"370","DOI":"10.1109\/JPROC.2005.862424","article-title":"The sorcerer’s apprentice guide to fault attacks","volume":"94","author":"bar-el","year":"0","journal-title":"Proc IEEE"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1145\/3287560.3287562"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9967421\/09530205.pdf?arnumber=9530205","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,19]],"date-time":"2022-12-19T19:37:54Z","timestamp":1671478674000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9530205\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":58,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2021.3105697","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}