{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T19:42:22Z","timestamp":1774640542708,"version":"3.50.1"},"reference-count":55,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100010261","name":"National Key R&amp;D Program of China","doi-asserted-by":"publisher","award":["2018YFB1403400"],"award-info":[{"award-number":["2018YFB1403400"]}],"id":[{"id":"10.13039\/501100010261","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61702544"],"award-info":[{"award-number":["61702544"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Natural Science Foundation of Jiangsu Province, China","award":["BK20160769"],"award-info":[{"award-number":["BK20160769"]}]},{"DOI":"10.13039\/501100010261","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2016M603031"],"award-info":[{"award-number":["2016M603031"]}],"id":[{"id":"10.13039\/501100010261","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2021,12]]},"DOI":"10.1109\/tr.2021.3106389","type":"journal-article","created":{"date-parts":[[2021,9,9]],"date-time":"2021-09-09T19:57:39Z","timestamp":1631217459000},"page":"1397-1421","source":"Crossref","is-referenced-by-count":16,"title":["MT-ART: A Test Case Generation Method Based on Adaptive Random Testing and Metamorphic Relation"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2709-6834","authenticated-orcid":false,"given":"Zhan-wei","family":"Hui","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaojuan","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Song","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2263-8000","authenticated-orcid":false,"given":"Sen","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3724\/SP.J.1001.2009.00578"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/1007512.1007533"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/DSA.2017.31"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2896971.2896974"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2007.4385510"},{"key":"ref30","first-page":"19","article-title":"Iterative metamorphic testing","author":"wu","year":"2005","journal-title":"Proc 29th Annu Int IEEE Comput Softw Appl Conf"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/0950-5849(96)01103-2"},{"key":"ref36","article-title":"Metamorphic testing techniques for error detection efficiency","author":"dong","year":"2009"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.3724\/SP.J.1016.2009.01002"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2532875"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/MET.2016.010"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1363102.1363107"},{"key":"ref29","first-page":"277","article-title":"A novel metamorphic test case generation method based on ART","author":"hui","year":"2014","journal-title":"Proc 8th China Testing Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2372785"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2017.276"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/1982185.1982502"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2017.86"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.02.022"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2975954.2975959"},{"key":"ref23","first-page":"78","article-title":"A revisit adaptive random testing by restriction","author":"chan","year":"2004","journal-title":"Proc 28th Annu Int Comput Softw Appl Conf"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1363102.1363107"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2455981"},{"key":"ref50","first-page":"352","article-title":"Inter-class mutation operators for java","author":"ma","year":"2002","journal-title":"Proc 13th Int Symp Softw Rel Eng"},{"key":"ref51","first-page":"512","article-title":"Empirical evaluation of orthogonality of class mutation operators","author":"lee","year":"2004","journal-title":"Proc Asia-Pacific Software Eng Conf"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2942921"},{"key":"ref54","article-title":"Research on metamorphic testing","author":"hui","year":"2015"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.1994.296778"},{"key":"ref52","author":"xie","year":"2012","journal-title":"On the Analysis of Spectrum-Based Fault Localization"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1109\/TSE.2013.46","article-title":"How effectively does metamorphic testing alleviate the oracle problem?","volume":"40","author":"huai","year":"2014","journal-title":"IEEE Trans Softw Eng"},{"key":"ref11","first-page":"569","article-title":"Case studies on the selection of useful relations in metamorphic testing","author":"chen","year":"2004","journal-title":"Proc 4th Ibero-Amer Symp Softw Eng Knowl Eng"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2005.05.029"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2006.24"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/WCSE.2013.14"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2642937.2642994"},{"key":"ref15","first-page":"128","article-title":"Metamorphic testing and testing with special values","author":"chen","year":"2004","journal-title":"Proc 21st ACIS Int Winter Conf Softw Eng Artif Intell Netw Parallel Distrib Comput"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1360\/jos161210"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSESS.2013.6615365"},{"key":"ref18","first-page":"1334","article-title":"Metamorphic testing: Using the properties of sut","volume":"2","author":"singh","year":"2011","journal-title":"Int J Comput Technol Appl"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2010.26"},{"key":"ref4","article-title":"Metamorphic testing: A new approach for generating next test cases","author":"chen","year":"1998"},{"key":"ref3","first-page":"44","article-title":"The oracle assumption of program testing","author":"weyuker","year":"1980","journal-title":"Proc 13th Int Conf Syst Sci"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2014.62"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2013.6698899"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2013.43"},{"key":"ref7","first-page":"152","article-title":"An automated metamorphic testing technique for designing effective metamorphic relations","author":"singh","year":"2012","journal-title":"Contemporary Computing"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/CMPASS.1996.507890"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2012.10"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528535"},{"key":"ref48","article-title":"Numerical recipes","author":"press","year":"2007","journal-title":"The Art of Scientific Computing"},{"key":"ref47","article-title":"L.D.R. Associates","year":"0"},{"key":"ref42","first-page":"929","article-title":"Prioritizing test cases for regression testing, software engineering","volume":"27","author":"rothermel","year":"2001","journal-title":"IEEE Trans"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.1994.341379"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1145\/267580.267590"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/C-M.1978.218136"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9629389\/09534673.pdf?arnumber=9534673","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,8]],"date-time":"2022-03-08T21:17:39Z","timestamp":1646774259000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9534673\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12]]},"references-count":55,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2021.3106389","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,12]]}}}