{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T10:17:44Z","timestamp":1774261064755,"version":"3.50.1"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72001138"],"award-info":[{"award-number":["72001138"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72071127"],"award-info":[{"award-number":["72071127"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72171120"],"award-info":[{"award-number":["72171120"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2019M661532"],"award-info":[{"award-number":["2019M661532"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/tr.2021.3107050","type":"journal-article","created":{"date-parts":[[2021,9,9]],"date-time":"2021-09-09T19:57:39Z","timestamp":1631217459000},"page":"47-62","source":"Crossref","is-referenced-by-count":25,"title":["Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2590-0307","authenticated-orcid":false,"given":"Zhen","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering and Management, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9121-1716","authenticated-orcid":false,"given":"Tangbin","family":"Xia","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering and Management, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0618-208X","authenticated-orcid":false,"given":"Yaping","family":"Li","sequence":"additional","affiliation":[{"name":"College of Economics and Management, Nanjing Forestry University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6026-9755","authenticated-orcid":false,"given":"Ershun","family":"Pan","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering and Management, Shanghai Jiao Tong University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2195"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2006.02.002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2484075"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2908492"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1198\/004017004000000464"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/00949659908811954"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.2307\/1270643"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2014.915891"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/asmb.2063"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2696341"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2393840"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2684821"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.02.005"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/00949655.2012.658805"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2033734"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.05.011"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2435774"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194351"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.08197"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.03.010"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.06.005"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.08.016"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1214\/13-AOAS666"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2008.06.013"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2051399"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2008.12.007"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1023\/B:LIDA.0000036389.14073.dd"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.879077"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2885133"},{"key":"ref30","first-page":"579","article-title":"An index which distinguishes between some important exponential families","volume-title":"Proc. Indian Statist. Inst. Golden Jubilee Int. Conf","author":"Tweedie"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2015.1033109"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2849087"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2895352"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2948173"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/APARM49247.2020.9209330"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1002\/nav.21923"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2955596"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106748"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2917058"},{"key":"ref40","first-page":"103","volume-title":"The Theory of Dispersion Models","author":"Jorgensen","year":"1997"},{"issue":"3","key":"ref41","first-page":"1461","article-title":"When is acceleration unnecessary in a degradation test","volume":"27","author":"Hong","year":"2017","journal-title":"Statistica Sinica"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/S0266-8920(02)00053-X"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1002\/9780470117880"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-77950-8"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.08.004"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/9725327\/09534486.pdf?arnumber=9534486","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:10:34Z","timestamp":1705014634000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9534486\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":45,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2021.3107050","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,3]]}}}