{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T11:48:58Z","timestamp":1781264938127,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973024"],"award-info":[{"award-number":["61973024"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62073022"],"award-info":[{"award-number":["62073022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973022"],"award-info":[{"award-number":["61973022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/tr.2021.3139539","type":"journal-article","created":{"date-parts":[[2022,1,20]],"date-time":"2022-01-20T20:24:12Z","timestamp":1642710252000},"page":"204-213","source":"Crossref","is-referenced-by-count":44,"title":["Improved Locality Preserving Projections Based on Heat-Kernel and Cosine Weights for Fault Classification in Complex Industrial Processes"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6793-1518","authenticated-orcid":false,"given":"Ning","family":"Zhang","sequence":"first","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5490-2892","authenticated-orcid":false,"given":"Yuan","family":"Xu","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2719-0516","authenticated-orcid":false,"given":"Qun-Xiong","family":"Zhu","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9999-3679","authenticated-orcid":false,"given":"Yan-Lin","family":"He","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3090310"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3115108"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2668986"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3075234"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.0c01071"},{"issue":"1","key":"ref6","first-page":"9","article-title":"Survey on data driven fault diagnosis methods","volume":"26","author":"Li","year":"2011","journal-title":"Control Decis."},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2920903"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.6b03045"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2019.2936793"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(99)00061-1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3016966"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1126\/science.290.5500.2323"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1162\/089976603321780317"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2005.167"},{"issue":"3","key":"ref16","first-page":"328","article-title":"Face recognition using Laplacian faces","volume":"3","author":"He","year":"2005","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/421671"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2726188"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2005.11.006"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b03752"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3056533"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2962275"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2020.103631"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2021.07.004"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2977421"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.0c02209"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/DDCLS52934.2021.9455580"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2019.04.009"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2018.09.696"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10057590\/09687299.pdf?arnumber=9687299","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T22:22:00Z","timestamp":1705184520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9687299\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":29,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2021.3139539","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,3]]}}}