{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,5]],"date-time":"2026-02-05T22:55:49Z","timestamp":1770332149104,"version":"3.49.0"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61703060"],"award-info":[{"award-number":["61703060"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12061088"],"award-info":[{"award-number":["12061088"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61802036"],"award-info":[{"award-number":["61802036"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61873305"],"award-info":[{"award-number":["61873305"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Sichuan Science and Technology Program","award":["21YYJC0469"],"award-info":[{"award-number":["21YYJC0469"]}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2020M683274"],"award-info":[{"award-number":["2020M683274"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Open Research Project of the State Key Laboratory of Industrial Control Technology"},{"DOI":"10.13039\/501100004835","name":"Zhejiang University","doi-asserted-by":"publisher","award":["ICT2021B38"],"award-info":[{"award-number":["ICT2021B38"]}],"id":[{"id":"10.13039\/501100004835","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021171","name":"Basic and Applied Basic Research Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2021A1515011692"],"award-info":[{"award-number":["2021A1515011692"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2023,9]]},"DOI":"10.1109\/tr.2022.3215075","type":"journal-article","created":{"date-parts":[[2022,11,4]],"date-time":"2022-11-04T01:08:44Z","timestamp":1667524124000},"page":"1220-1231","source":"Crossref","is-referenced-by-count":21,"title":["Reliable Sampling Mechanism for Takagi\u2013Sugeno Fuzzy NCSs Under Deception Cyberattacks for the Application of the Inverted Pendulum System"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3400-5566","authenticated-orcid":false,"given":"Xiao","family":"Cai","sequence":"first","affiliation":[{"name":"School of Information and Software Engineering, University of Electronic Science and Technology of China, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9863-9229","authenticated-orcid":false,"given":"Kaibo","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Chengdu University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9839-0259","authenticated-orcid":false,"given":"Kun","family":"She","sequence":"additional","affiliation":[{"name":"School of Information and Software Engineering, University of Electronic Science and Technology of China, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0334-6117","authenticated-orcid":false,"given":"Shouming","family":"Zhong","sequence":"additional","affiliation":[{"name":"School of Mathematics Sciences, University of Electronic Science and Technology of China, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0624-2302","authenticated-orcid":false,"given":"Yeng Chai","family":"Soh","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3452-8391","authenticated-orcid":false,"given":"Yue","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Information and Software Engineering, University of Electronic Science and Technology of China, Chengdu, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCNS.2016.2614099"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2017.04.051"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2021.3052940"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2021.03.042"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2462741"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.2996743"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2817249"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2019.2914367"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2019.2892356"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2011.2174244"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.fss.2021.08.018"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.02.036"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3030028"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2018.2852281"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3166\/ejc.9.144-158"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2017.05.092"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"2032","DOI":"10.1109\/TFUZZ.2021.3073264","article-title":"Event-based secure control of T-S fuzzy based 5-DOF active semi-vehicle suspension systems subject to DoS attacks","volume":"30","author":"yuan","year":"2022","journal-title":"IEEE Trans Fuzzy Syst"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3050209"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2021.3106674"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2022.110321"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2021.3052104"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2021.3121414"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2018.05.019"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2022.3145816"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2022.126975"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2016.0135"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2015.2498708"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2351871"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3005283"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2656386"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2009.2036293"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2018.11.011"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2012.09.007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2017.08.042"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2016.02.037"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2219540"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-85729-033-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2035462"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/37.898794"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2022.3177469"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10236915\/09933362.pdf?arnumber=9933362","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T18:16:31Z","timestamp":1695665791000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9933362\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9]]},"references-count":40,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2022.3215075","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,9]]}}}