{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:29:28Z","timestamp":1772119768159,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72071007"],"award-info":[{"award-number":["72071007"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71971181"],"award-info":[{"award-number":["71971181"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tr.2022.3224170","type":"journal-article","created":{"date-parts":[[2022,12,2]],"date-time":"2022-12-02T20:56:27Z","timestamp":1670014587000},"page":"1556-1568","source":"Crossref","is-referenced-by-count":20,"title":["Mission Reliability Modeling of Multistation Manufacturing Systems Considering Cascading Functional Failure"],"prefix":"10.1109","volume":"72","author":[{"given":"Yao","family":"Li","sequence":"first","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9110-2672","authenticated-orcid":false,"given":"Yihai","family":"He","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruoyu","family":"Liao","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xin","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7376-6977","authenticated-orcid":false,"given":"Wei","family":"Dai","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.09.018"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2018.1508906"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2017.1395491"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106707"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3062030"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2907517"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3128514"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2012.718451"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.05.005"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.107090"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2035795"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2020.1713416"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.04.003"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2022.2137595"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.03.024"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.03.011"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2957502"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2220898"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.3033296"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1177\/0954405420971080"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2720633"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2591504"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.853441"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2503751"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2017.2671354"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2022.3154153"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/qre.3095"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10033-017-0144-y"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-017-1382-7"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2927008"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107560"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2021.107166"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2846649"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.108211"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2015.11.019"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10339143\/09969445.pdf?arnumber=9969445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:06:20Z","timestamp":1706753180000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9969445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":35,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2022.3224170","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}