{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T18:41:39Z","timestamp":1772131299694,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key R&D Programs of China","award":["2021YFA1000300"],"award-info":[{"award-number":["2021YFA1000300"]}]},{"name":"National Key R&D Programs of China","award":["2021YFA1000301"],"award-info":[{"award-number":["2021YFA1000301"]}]},{"DOI":"10.13039\/100000893","name":"Simons Foundation","doi-asserted-by":"publisher","award":["#709773"],"award-info":[{"award-number":["#709773"]}],"id":[{"id":"10.13039\/100000893","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Chinese NSF","award":["12171451"],"award-info":[{"award-number":["12171451"]}]},{"DOI":"10.13039\/501100019795","name":"National Center for Mathematics and Interdisciplinary Sciences, Chinese Academy of Sciences","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100019795","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Laboratory of Systems and Control of CAS"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tr.2022.3229262","type":"journal-article","created":{"date-parts":[[2023,1,5]],"date-time":"2023-01-05T18:50:14Z","timestamp":1672944614000},"page":"1453-1465","source":"Crossref","is-referenced-by-count":5,"title":["Optimal Acceptance Sampling Testing Plan With Pivotal Quantity for Log-Location-Scale Distributions"],"prefix":"10.1109","volume":"72","author":[{"given":"Zan","family":"Li","sequence":"first","affiliation":[{"name":"School of Statistics and Data Science, KLMDASR, and LPMC, Nankai University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4685-2199","authenticated-orcid":false,"given":"Hon Keung Tony","family":"Ng","sequence":"additional","affiliation":[{"name":"Department of Mathematical Sciences, Bentley University, Waltham, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dan","family":"Yu","sequence":"additional","affiliation":[{"name":"Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3702-974X","authenticated-orcid":false,"given":"Qingpei","family":"Hu","sequence":"additional","affiliation":[{"name":"Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1108\/IJQRM-04-2018-0107"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2004.833317"},{"key":"ref3","article-title":"Statistical estimates and transformed beta-variables","author":"Blom","year":"1958"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2161701"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2020.03.001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2167782"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-77950-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2307\/2333139"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2002.801845"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2015.11918138"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2014.964413"},{"issue":"6","key":"ref12","first-page":"986","article-title":"The quantile-filling algorithm for Weibull distribution under Type-I censored data","volume":"30","author":"Jiang","year":"2007","journal-title":"Acta Mathematicae Applicatae Sinica"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2315938"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.863802"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2014.990035"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/9781118033005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2015.12.621"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2115"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2019.1630869"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.2307\/2987656"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2016.11918172"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.11.014"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1198\/004017005000000030"},{"issue":"3","key":"ref24","first-page":"351","article-title":"Extreme (X-) testing with binary data and applications to reliability demonstration","volume":"52","author":"Mease","year":"2007","journal-title":"Qual. Eng."},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1080\/16843703.2004.11673062"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2015.1054939"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1198\/016214504000000214"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1989.10488513"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.2307\/2332153"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2010.543938"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/24.963127"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2020.1867646"},{"issue":"3","key":"ref33","first-page":"270","article-title":"Reliability sampling inspection for two-parameter Weibull distribution","volume":"20","author":"Wu","year":"2004","journal-title":"Chin. J. Appl. Probability Statist."},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1080\/00949655.2012.716441"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0189863"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2138"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s11425-006-0410-4"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1214\/14-AOAS752"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2417373"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2014.01.010"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10339143\/10007066.pdf?arnumber=10007066","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T14:22:17Z","timestamp":1709389337000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10007066\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":40,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2022.3229262","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}