{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,20]],"date-time":"2026-04-20T13:27:45Z","timestamp":1776691665381,"version":"3.51.2"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2019YFB1705300"],"award-info":[{"award-number":["2019YFB1705300"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["JZ2022HGQA0138"],"award-info":[{"award-number":["JZ2022HGQA0138"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72271077"],"award-info":[{"award-number":["72271077"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72101071"],"award-info":[{"award-number":["72101071"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72101077"],"award-info":[{"award-number":["72101077"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tr.2022.3233893","type":"journal-article","created":{"date-parts":[[2023,1,11]],"date-time":"2023-01-11T22:04:48Z","timestamp":1673474688000},"page":"1407-1419","source":"Crossref","is-referenced-by-count":11,"title":["Group Maintenance for Numerical Control Machine Tools: A Case Study"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8913-9265","authenticated-orcid":false,"given":"Rui","family":"Zheng","sequence":"first","affiliation":[{"name":"School of Management, Hefei University of Technology, Hefei, China"}]},{"given":"Xiaofei","family":"Qian","sequence":"additional","affiliation":[{"name":"School of Management, Hefei University of Technology, Hefei, China"}]},{"given":"Liudong","family":"Gu","sequence":"additional","affiliation":[{"name":"School of Mathematics, Southeast University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.101842"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2016.07.083"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3068633"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2021.107135"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1198\/004017002188618707"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11771-014-2453-y"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-1638(199707)13:4<183::AID-QRE104>3.0.CO;2-5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2014.893067"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-018-2233-1"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.02.029"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2020.106322"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2021.107157"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.17531\/ein.2017.4.15"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-020-05202-3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.2995277"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2021.10.028"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2019.106029"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106705"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-021-07752-6"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.01.002"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1287\/ijoc.2018.0863"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107450"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106704"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2955500"},{"key":"ref25","volume-title":"Maintenance Theory of Reliability","author":"Nakagawa","year":"2005"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tr.2021.3111682"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2020.106876"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-017-1382-7"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/qre.3007"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.108132"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1002\/047147326x"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2337791"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.07.017"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1504\/EJIE.2011.039870"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2011.2118772"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-54209-5"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.7551\/mitpress\/3927.001.0001"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2012.06.019"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107669"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/PHM-Chongqing.2018.00079"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10339143\/10015200.pdf?arnumber=10015200","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T14:55:33Z","timestamp":1709391333000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10015200\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":40,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tr.2022.3233893","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}