{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T13:16:33Z","timestamp":1773234993479,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12272300"],"award-info":[{"award-number":["12272300"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2022M722395"],"award-info":[{"award-number":["2022M722395"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Basic Research Program of Shenzhen","award":["JCYJ 20190806142816524"],"award-info":[{"award-number":["JCYJ 20190806142816524"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tr.2023.3245058","type":"journal-article","created":{"date-parts":[[2023,3,2]],"date-time":"2023-03-02T18:23:14Z","timestamp":1677781394000},"page":"370-383","source":"Crossref","is-referenced-by-count":8,"title":["Two-Phase Adaptive Kriging Model Based Importance Sampling Method for Estimating Time-Dependent Failure Probability"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4325-6992","authenticated-orcid":false,"given":"Kaixuan","family":"Feng","sequence":"first","affiliation":[{"name":"School of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5263-5767","authenticated-orcid":false,"given":"Zhenzhou","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Aeronautics, Northwestern Polytechnical University, Xi'an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7248-329X","authenticated-orcid":false,"given":"Nan","family":"Ye","sequence":"additional","affiliation":[{"name":"School of Aeronautics, Northwestern Polytechnical University, Xi'an, China"}]},{"given":"Pengfei","family":"He","sequence":"additional","affiliation":[{"name":"School of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai, China"}]},{"given":"Ying","family":"Dai","sequence":"additional","affiliation":[{"name":"School of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3085582"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2514\/1.J057529"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.3001232"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tr.2022.3200137"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108824"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108794"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s00158-012-0839-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107931"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1944.tb00874.x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2003.10.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/15732470701270058"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1115\/1.4027636"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1997.10485133"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.05.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1115\/1.4033428"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00158-021-02975-3"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-4730(99)00014-4"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.strusafe.2007.10.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0266-8920(01)00019-4"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/0167-4730(93)90018-V"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s00158-022-03229-6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.strusafe.2015.12.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106644"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0733-9399(2002)128:4(380)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)EM.1943-7889.0000839"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0733-9399(1993)119:6(1136)"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-3094-6"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0733-9399(1994)120:12(2660)"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.strusafe.2011.01.002"},{"key":"ref30","volume-title":"Aspects of the Matlab Toolbox DACE","author":"Lophaven","year":"2002"},{"issue":"4","key":"ref31","first-page":"455","volume-title":"Efficient Global Optimization of Expensive Black-Box Functions","volume":"13","author":"Jones","year":"1998"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.probengmech.2013.02.002"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36487-0_8"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1987.10488205"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1974.tb00994.x"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1115\/1.4034219"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s00158-021-02848-9"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1115\/1.4029520"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1115\/1.4035860"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.107261"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10460370\/10057981.pdf?arnumber=10057981","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T00:59:54Z","timestamp":1733878794000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10057981\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":40,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2023.3245058","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}