{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T13:46:06Z","timestamp":1780407966103,"version":"3.54.1"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tr.2023.3250494","type":"journal-article","created":{"date-parts":[[2023,4,24]],"date-time":"2023-04-24T18:20:40Z","timestamp":1682360440000},"page":"384-398","source":"Crossref","is-referenced-by-count":5,"title":["A Cocktail of Bidirectional Tests for Power Symmetry and Repairable System Reliability"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5368-9337","authenticated-orcid":false,"given":"Chih-Hsiang","family":"Ho","sequence":"first","affiliation":[{"name":"Department of Mathematical Sciences, University of Nevada, Las Vegas, NV, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6132-1420","authenticated-orcid":false,"given":"Sung Keun","family":"Koo","sequence":"additional","affiliation":[{"name":"Department of Mathematical Sciences, University of Nevada, Las Vegas, NV, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7403-7242","authenticated-orcid":false,"given":"Moinak","family":"Bhaduri","sequence":"additional","affiliation":[{"name":"Department of Mathematical Sciences, Bentley University, Waltham, MA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Libo","family":"Zhou","sequence":"additional","affiliation":[{"name":"Department of Mathematical Sciences, University of Nevada, Las Vegas, NV, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1955.tb00188.x"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1007\/978-94-011-7801-3","volume-title":"The Statistical Analysis of Series of Events","author":"Cox","year":"1966"},{"key":"ref3","volume-title":"Repairable Systems Reliability: Modeling, Inference, Misconceptions and Their Causes","author":"Ascher","year":"1984"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1987.5222421"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/03610929808832152"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-1384-0"},{"key":"ref7","volume-title":"Statistical Methods for the Reliability of Repairable Systems, Wiley Series in Probability and Statistics","author":"Rigdon","year":"2000"},{"key":"ref8","volume-title":"Reliability Theory With Applications to Preventive Maintenance","author":"Gertsbakh","year":"2005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1201\/9781420080834"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1201\/b11787"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1201\/9781315382425"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-73540-5"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6348-2"},{"key":"ref14","doi-asserted-by":"crossref","DOI":"10.1002\/9781119526582","volume-title":"Repairable Systems Reliability Analysis (Performability Engineering Series)","author":"Rai","year":"2020"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-64708-7"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/0377-0273(90)90046-I"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/BF02066293"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/BF00890701"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-0273(96)00057-1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s11004-017-9692-z"},{"issue":"7","key":"ref21","first-page":"64","article-title":"Time series analysis for predicting the occurrences of large scale earthquakes","volume":"2","author":"Amei","year":"2012","journal-title":"Int. J. Appl. Sci. Technol."},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.4236\/gep.2014.23003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s00445-009-0309-3"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/BF02769647"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1023\/A:1021785910495"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/BF00278205"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s00445-006-0058-5"},{"issue":"1","key":"ref28","first-page":"1","article-title":"Modeling interaction between bank failure and size","volume":"4","author":"Ho","year":"2016","journal-title":"J. Finance Bank Manage."},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvolgeores.2007.12.003"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/03610926.2014.936560"},{"key":"ref31","article-title":"Bi-directional testing for change point detection in Poisson processes","author":"Bhaduri","year":"2018"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-020-72803-z"},{"key":"ref33","first-page":"379","volume-title":"Reliability Analysis for Complex Repairable Systems, Reliability and Biometry","author":"Crow","year":"1974"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1214\/088342306000000448"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2693155"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2832022"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2943446"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3068633"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.2307\/1267924"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1978.10489616"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1980.10486174"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.2307\/1267580"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1201\/9780203738733"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1080\/00949659308811555"},{"key":"ref45","first-page":"173","article-title":"Increasing hazard functions and overhaul policy","volume-title":"Proc. IEEE Annu. Symp. Rel.","author":"Bassin","year":"1969"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1985.10478133"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/24.103018"},{"key":"ref48","volume-title":"Introduction to Probability and Statistics Using R","author":"Kerns","year":"2010"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TA.1964.4319640"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2580"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2901"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10460370\/10107533.pdf?arnumber=10107533","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T01:02:25Z","timestamp":1733878945000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10107533\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":51,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2023.3250494","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}