{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T12:19:01Z","timestamp":1772799541936,"version":"3.50.1"},"reference-count":57,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12071372"],"award-info":[{"award-number":["12071372"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11528102"],"award-info":[{"award-number":["11528102"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12201395"],"award-info":[{"award-number":["12201395"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11901134"],"award-info":[{"award-number":["11901134"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["JBK2304036"],"award-info":[{"award-number":["JBK2304036"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["JBK1806002"],"award-info":[{"award-number":["JBK1806002"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000893","name":"Simons Foundation","doi-asserted-by":"publisher","award":["709773"],"award-info":[{"award-number":["709773"]}],"id":[{"id":"10.13039\/100000893","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tr.2023.3307678","type":"journal-article","created":{"date-parts":[[2023,9,7]],"date-time":"2023-09-07T17:32:17Z","timestamp":1694107937000},"page":"560-575","source":"Crossref","is-referenced-by-count":5,"title":["Robust Estimation and Selection for Degradation Modeling With Inhomogeneous Increments"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4733-9752","authenticated-orcid":false,"given":"Zhang","family":"Fode","sequence":"first","affiliation":[{"name":"Center of Statistical Research, School of Statistics, Southwestern University of Finance and Economics, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4685-2199","authenticated-orcid":false,"given":"Hon Keung Tony","family":"Ng","sequence":"additional","affiliation":[{"name":"Department of Mathematical Sciences, Bentley University, Waltham, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3906-4250","authenticated-orcid":false,"given":"Lijuan","family":"Shen","sequence":"additional","affiliation":[{"name":"Future Resilient Systems, Singapore-ETH Centre, Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-4-431-55978-8"},{"key":"ref2","volume-title":"Differential-Geometrical Methods in Statistics (Lecture Notes in Statistics)","author":"Amari","year":"1985"},{"key":"ref3","volume-title":"Information Geometry and Its Applications","author":"Nihat","year":"2018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s41884-018-0002-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1974.1100705"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1966.tb00626.x"},{"key":"ref7","volume-title":"Handbook of Statistics20 Advances in Reliability","author":"Balakrishnan","year":"2001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-4076(01)00113-0"},{"key":"ref9","volume-title":"Degradation Processes in Reliability","author":"Waltraud","year":"2018"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/nav.21875"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2014.2320500"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-0865-5"},{"issue":"5","key":"ref13","first-page":"3150","article-title":"On $f$-divergences between cauchy distributions","volume-title":"IEEE Trans. Inf. Theory","volume":"69","author":"Frank","year":"2022"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1214\/13-EJS847"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-17146-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-26980-7"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2022.3177896"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3021054"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1561\/2200000058"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.109021"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.11.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2015.1109739"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2885133"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tit.2023.3268527"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106784"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.108136"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2020.1796814"},{"key":"ref29","volume-title":"Achieving Product Reliability","author":"Necip","year":"2021"},{"key":"ref30","volume-title":"Statistical Methods for Reliability Data","author":"Meeker","year":"1998"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/S1573-4412(05)80005-4"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.08.004"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2010.2068870"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2019.12.006"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2019.2958705"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2635149"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-5194-4_10"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1991.tb01857.x"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2019.1668855"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-85359-8"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2022.03.039"},{"key":"ref42","volume-title":"Nonparametric Statistical Methods","author":"Myles","year":"2015"},{"key":"ref43","volume-title":"Asymtotic Statistics (Cambridge Series in Statistical and Probabilistic Mathematics)","volume":"22","author":"van der Vaart","year":"1998"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2545-2"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-663-14229-4"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2019.1710194"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106631"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1214\/0009053607000000244"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2791616"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2948173"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2018.2879057"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2022.2157881"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.07.003"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2017.2774820"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106751"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2022.3169885"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109427"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10460370\/10243116.pdf?arnumber=10243116","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T01:02:40Z","timestamp":1733878960000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10243116\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":57,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2023.3307678","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}