{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,26]],"date-time":"2026-07-26T08:13:36Z","timestamp":1785053616324,"version":"3.55.0"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075008"],"award-info":[{"award-number":["52075008"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52305086"],"award-info":[{"award-number":["52305086"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1109\/tr.2023.3328597","type":"journal-article","created":{"date-parts":[[2023,11,13]],"date-time":"2023-11-13T19:14:44Z","timestamp":1699902884000},"page":"1270-1279","source":"Crossref","is-referenced-by-count":54,"title":["Auto-Embedding Transformer for Interpretable Few-Shot Fault Diagnosis of Rolling Bearings"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3084-8825","authenticated-orcid":false,"given":"Gang","family":"Wang","sequence":"first","affiliation":[{"name":"Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2638-3014","authenticated-orcid":false,"given":"Dongdong","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2883-4018","authenticated-orcid":false,"given":"Lingli","family":"Cui","sequence":"additional","affiliation":[{"name":"Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3192597"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/acc.2005.1470385"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2882682"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3039648"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3163167"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.106587"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ace98a"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acf390"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmecsci.2022.107708"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3188646"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3117732"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110427"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3146151"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.06.066"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120696"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3225013"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3008177"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3140403"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3028821"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2968370"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2021.12.054"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.04.111"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2022.3215243"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.12.003"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref26","first-page":"2750","article-title":"An image is worth 1616 words: Transformers for image recognition at scale","author":"Dosovitskiy","journal-title":"Proc. Int. Conf. Learn. Representations"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3152247"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3169528"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3181933"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.106530"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3058061"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01553"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108673"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2022.3230458"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2021.108391"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.12.051"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109319"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s11465-021-0650-6"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2020.3048950"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111228"},{"key":"ref42","article-title":"Case Western Reserve University Bearing Data Center","author":"Yu","year":"2014"},{"key":"ref43","first-page":"1","article-title":"Adam: A method for stochastic optimization","author":"Kingma","journal-title":"Proc. Int. Conf. Learn. Representations"},{"key":"ref44","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"van der Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10547161\/10315955.pdf?arnumber=10315955","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,10]],"date-time":"2024-09-10T07:37:31Z","timestamp":1725953851000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10315955\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6]]},"references-count":44,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tr.2023.3328597","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,6]]}}}