{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T11:51:09Z","timestamp":1775476269612,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key R&D Program of China","award":["2021YFA1000300"],"award-info":[{"award-number":["2021YFA1000300"]}]},{"name":"National Key R&D Program of China","award":["2021YFA1000301"],"award-info":[{"award-number":["2021YFA1000301"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2025,3]]},"DOI":"10.1109\/tr.2024.3398652","type":"journal-article","created":{"date-parts":[[2024,5,23]],"date-time":"2024-05-23T13:49:22Z","timestamp":1716472162000},"page":"2265-2279","source":"Crossref","is-referenced-by-count":6,"title":["Multivariate $t$ Degradation Processes for Dependent Multivariate Degradation Data"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-0464-4319","authenticated-orcid":false,"given":"Qifang","family":"Liu","sequence":"first","affiliation":[{"name":"Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2669-4939","authenticated-orcid":false,"given":"Lu","family":"Jin","sequence":"additional","affiliation":[{"name":"Department of Informatics, University of Electro-Communications, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4685-2199","authenticated-orcid":false,"given":"Hon Keung Tony","family":"Ng","sequence":"additional","affiliation":[{"name":"Department of Mathematical Sciences, Bentley University, Waltham, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3702-974X","authenticated-orcid":false,"given":"Qingpei","family":"Hu","sequence":"additional","affiliation":[{"name":"Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9190-2090","authenticated-orcid":false,"given":"Dan","family":"Yu","sequence":"additional","affiliation":[{"name":"Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/asmb.2063"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-5194-4_3"},{"key":"ref3","article-title":"Design of accelerated degradation test","author":"Li","year":"2013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2284733"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.107358"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2026784"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106751"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2022.2089784"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1022"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2010.534227"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/243648"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/829597"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.107230"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2058"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2020.1757704"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1177\/0962280212445834"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.108200"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2022.2157881"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2020.1796814"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2023.2242413"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2019.1630008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2008.12.007"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.5705\/ss.2009.306"},{"key":"ref24","article-title":"Cubature: Adaptive multivariate integration over hypercubes","author":"Narasimhan","year":"2023"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.2307\/2290063"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.2307\/1912526"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2013.875566"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-5194-4_10"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0266-8920(02)00053-X"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2021.10.049"},{"key":"ref31","volume-title":"Statistical Methods for Reliability Data","author":"Meeker","year":"1998"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1002\/9780470117880"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1002\/9780470192610"},{"key":"ref34","volume-title":"Matrix Analysis for Statistics","author":"Schott","year":"2016"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1198\/jasa.2009.tm08273"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10909743\/10538172.pdf?arnumber=10538172","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T18:31:27Z","timestamp":1765909887000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10538172\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3]]},"references-count":35,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2024.3398652","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,3]]}}}