{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,23]],"date-time":"2026-07-23T17:25:01Z","timestamp":1784827501987,"version":"3.55.0"},"reference-count":57,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Department of Mathematics and Information Technology"},{"name":"Education University of Hong Kong, Hong Kong Special Administrative Region, China","award":["MIT\/DRG01\/24-25"],"award-info":[{"award-number":["MIT\/DRG01\/24-25"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tr.2024.3480969","type":"journal-article","created":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T13:30:43Z","timestamp":1730208643000},"page":"3017-3027","source":"Crossref","is-referenced-by-count":7,"title":["Optimal Designs of Multiple Step-Stress Accelerated Life Tests for One-Shot Devices With Weibull Lifetime Distributions"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9954-8302","authenticated-orcid":false,"given":"Man Ho","family":"Ling","sequence":"first","affiliation":[{"name":"Department of Mathematics and Information Technology, The Education University of Hong Kong, Hong Kong SAR, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00362-013-0521-2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2430451"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.106875"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/03610926.2020.1788081"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2024.3369977"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/9780470316795"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2007.02.008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00949650802142592"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.03.021"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.08.007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2017.1310233"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2023.2224524"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2954385"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3062289"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2023.10.037"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108319"},{"issue":"4","key":"ref17","first-page":"21","article-title":"Selecting optimal preventive maintenance periods for one-shot devices: A new fuzzy decision approach","volume":"12","author":"Azimian","year":"2021","journal-title":"Prod. Oper. Manage."},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/03610926.2020.1725827"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/math9233032"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2023.2288802"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2024.110452"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107595"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X211058938"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2022.2089855"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2024.01.022"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1080\/03610926.2021.1927755"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/qre.3031"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X221108850"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2023.115483"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/9781119664031"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1198\/004017005000000373"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.04.017"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1080\/16843703.2022.2093577"},{"key":"ref34","volume-title":"Statistical Methods for Reliability Data.","author":"Meeker","year":"2022"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.106795"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3390\/math10050840"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221475"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.03.026"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106630"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.0001"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1591\/aad31a"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2008.05.046"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1017\/S0269964818000049"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2772"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2336391"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1980.5220742"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/24.877341"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.01.009"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1080\/16843703.2016.1189179"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.03.010"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2133"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2018.1437475"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2020.1830418"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1002\/nav.22009"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109242"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(01)00123-5"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2020.1803911"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/24\/11152618\/10737405.pdf?arnumber=10737405","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T18:32:51Z","timestamp":1766082771000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10737405\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":57,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2024.3480969","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}