{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T20:37:14Z","timestamp":1768423034422,"version":"3.49.0"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tr.2025.3528074","type":"journal-article","created":{"date-parts":[[2025,2,19]],"date-time":"2025-02-19T13:44:51Z","timestamp":1739972691000},"page":"3809-3823","source":"Crossref","is-referenced-by-count":2,"title":["A Deep-Learning-Based Framework to Predict the Reliability of Multicomponent Repairable Systems in a Closed-Loop Supply Chain"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0641-9470","authenticated-orcid":false,"given":"Abdelhamid","family":"Boujarif","sequence":"first","affiliation":[{"name":"Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5825-2548","authenticated-orcid":false,"given":"David W.","family":"Coit","sequence":"additional","affiliation":[{"name":"Department of Industrial, Systems Engineering, Rutgers University, Piscataway, NJ, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oualid","family":"Jouini","sequence":"additional","affiliation":[{"name":"Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4937-4380","authenticated-orcid":false,"given":"Zhiguo","family":"Zeng","sequence":"additional","affiliation":[{"name":"Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-0639-7581","authenticated-orcid":false,"given":"Robert","family":"Heidsieck","sequence":"additional","affiliation":[{"name":"General Electric Healthcare, Buc, France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"crossref","first-page":"1437","DOI":"10.1016\/j.spc.2021.02.018","article-title":"Principles for a sustainable circular economy","volume":"27","author":"Velenturf","year":"2021","journal-title":"Sustain. Prod. Consumption"},{"key":"ref2","first-page":"346","article-title":"Closed-loop supply chain inventory-location problem with spare parts in a multi-modal repair condition","volume":"31","author":"Yadegari","year":"2017","journal-title":"Int. J. Eng. Trans. B, Appl."},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-20183-7_53"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2024.110642"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10916-020-1534-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.03.022"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3036728"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1201\/9780429268922-4"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2006.08.002"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1177\/1475921719865718"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-020-05202-3"},{"key":"ref12","first-page":"9","article-title":"Predicting complex system reliability through neural network considering interval censored component failure data with dependencies","volume-title":"Proc. Complex Syst. Crit. Infrastructures Rel. Saf. Secur. Model. Optim.","author":"Boujarif","year":"2024"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-52425-2_1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.10.001"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3934\/math.2022994"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109515"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2017.04.003"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/app11041697"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-0864-6_9"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109144"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlp.2009.07.013"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X13492954"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlp.2019.04.004"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/72.392253"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.133"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyai.2023.100233"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108908"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.08.004"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2022.109217"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-021-09532-6"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1186\/s12874-022-01679-6"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/su12166348"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1917285117"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2011659"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.3390\/sym10100495"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(98)00089-1"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1080\/07408170008967470"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TAI.2022.3185179"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.01.103"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s13042-020-01096-5"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-018-0004-1"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2019.03.034"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2836917"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1080\/02664769823250"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.6004\/jadpro.2016.7.1.8"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511754098"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/s00607-020-00816-7"},{"key":"ref48","article-title":"Kerastuner","author":"O\u2019Malley","year":"2019"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1177\/03611981221078281"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929009"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1348\/000711010X522227"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/24.9880"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/24\/11152618\/10892337.pdf?arnumber=10892337","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T17:45:23Z","timestamp":1757353523000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10892337\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":52,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2025.3528074","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}