{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T20:06:45Z","timestamp":1779739605469,"version":"3.53.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"Natural Science foundation of China","doi-asserted-by":"crossref","award":["12302107"],"award-info":[{"award-number":["12302107"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tr.2026.3684475","type":"journal-article","created":{"date-parts":[[2026,4,16]],"date-time":"2026-04-16T19:52:30Z","timestamp":1776369150000},"page":"1939-1948","source":"Crossref","is-referenced-by-count":0,"title":["Design and Validation of Corner Nonfunctional Solder Joint Canaries Using Damage Modeling and Four-Point Bending Tests"],"prefix":"10.1109","volume":"75","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-6699-5143","authenticated-orcid":false,"given":"Fan","family":"Yang","sequence":"first","affiliation":[{"name":"School of Science, Xi’an University of Architecture and Technology, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bofeng","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2388-3294","authenticated-orcid":false,"given":"Yuexing","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0326-5840","authenticated-orcid":false,"given":"Xiangyu","family":"Sun","sequence":"additional","affiliation":[{"name":"Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0879-4269","authenticated-orcid":false,"given":"Yao","family":"Yao","sequence":"additional","affiliation":[{"name":"School of Science, Xi’an University of Architecture and Technology, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-48532-6"},{"key":"ref2","article-title":"The use of canaries for adaptive health management of electronic systems","volume-title":"Proc. ADAPTIVE2010, IARIA Conf.","author":"Dasgupta"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2022.3144461"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/app9020227"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPT.2016.7583318"},{"key":"ref6","article-title":"An analytical model for developing a canary device to predict solder joint fatigue failure under thermal cycling conditions","author":"Mathew","year":"2015"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2326184"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICPHM.2012.6299546"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11040542"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPT.2018.8480428"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.118"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmps.2024.105623"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/ma17102365"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.04.008"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.12.009"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1115\/1.2809442"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.08.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.msea.2022.143876"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2025.115838"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1106\/105678902027281"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10854-024-13137-8"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2014.09.051"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1106\/105678902022259"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijfatigue.2023.107978"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSE.2015.7247996"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2023.3305935"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2022.118542"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijplas.2010.09.009"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0921-5093(00)00796-6"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/ma13245715"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/24\/11317936\/11482095.pdf?arnumber=11482095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T19:53:39Z","timestamp":1779738819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11482095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tr.2026.3684475","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}