{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,4]],"date-time":"2026-07-04T06:16:23Z","timestamp":1783145783720,"version":"3.54.6"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tr.2026.3703053","type":"journal-article","created":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T19:42:13Z","timestamp":1781293333000},"page":"2304-2318","source":"Crossref","is-referenced-by-count":0,"title":["MC-DT: Mechanism Compensation-Digital Twin Based Zero-Shot Diagnostic Scheme"],"prefix":"10.1109","volume":"75","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-4694-5644","authenticated-orcid":false,"given":"Zhongyu","family":"Gao","sequence":"first","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0024-987X","authenticated-orcid":false,"given":"Aibin","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yang","family":"Zhou","sequence":"additional","affiliation":[{"name":"Water Technology Research Center, Chemical and Biomolecular Engineering Department, Henry Samueli School of Engineering and Applied Science, University of California, Los Angeles, Los Angeles, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2024.124794"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3403908"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-024-02722-1"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3310075"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-023-02392-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111826"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/2631-8695\/ae39ad"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2021.117954"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2025.110563"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.119642"},{"key":"ref11","article-title":"Domain generalization for rotating machinery fault diagnosis: A survey","volume":"64","author":"Chen","year":"2025","journal-title":"Adv. Eng. Informat."},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3442884"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2024.111327"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3009600"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2024.110560"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2988208"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3210215"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00844"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00581"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120875"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2024.106099"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2024.109964"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.108990"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2025.112579"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3586376"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2009.2015956"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3071350"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-022-03665-3"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipm.2024.103898"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2024.3408048"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2025.3558163"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.107605"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2025.3526478"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3545713"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/24\/11317936\/11561550.pdf?arnumber=11561550","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,4]],"date-time":"2026-07-04T05:22:10Z","timestamp":1783142530000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11561550\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tr.2026.3703053","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}