{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T20:00:51Z","timestamp":1784923251465,"version":"3.55.0"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tr.2026.3711986","type":"journal-article","created":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T20:04:04Z","timestamp":1783973044000},"page":"2560-2574","source":"Crossref","is-referenced-by-count":0,"title":["MRT4Depth: Metamorphic Robustness Testing for Ground-Truth-Free Evaluation of Monocular Depth Estimation Models"],"prefix":"10.1109","volume":"75","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8067-423X","authenticated-orcid":false,"given":"Patience Chew Yee","family":"Cheah","sequence":"first","affiliation":[{"name":"University of Nottingham Ningbo China","place":["Ningbo, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5743-1010","authenticated-orcid":false,"given":"Boon Giin","family":"Lee","sequence":"additional","affiliation":[{"name":"University of Nottingham Ningbo China","place":["Ningbo, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0877-4353","authenticated-orcid":false,"given":"Dave","family":"Towey","sequence":"additional","affiliation":[{"name":"University of Nottingham Ningbo China","place":["Ningbo, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9674-3436","authenticated-orcid":false,"given":"David","family":"Chieng","sequence":"additional","affiliation":[{"name":"University of Nottingham Ningbo China","place":["Ningbo, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3578-0994","authenticated-orcid":false,"given":"Tsong Yueh","family":"Chen","sequence":"additional","affiliation":[{"name":"Swinburne University of Technology","place":["Hawthorn, VIC, Australia"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhi Quan","family":"Zhou","sequence":"additional","affiliation":[{"name":"University of Nottingham Ningbo China","place":["Ningbo, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.rineng.2025.105359"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2022.3160741"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IROS58592.2024.10802577"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.displa.2025.103086"},{"key":"ref5","article-title":"A systematic review of robustness in deep learning for computer vision: Mind the gap?","author":"Drenkow","year":"2022"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-023-01979-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3555803"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00751"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.52202\/075280-0932"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11548-025-03375-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2024.3412632"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11229-023-04334-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3677327"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2372785"},{"key":"ref15","article-title":"Evaluating robustness of monocular depth estimation with procedural scene perturbations","author":"Nugent","year":"2025"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3750050"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2018.2875968"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3143561"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2915065"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/QRS-C60940.2023.00058"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1910"},{"key":"ref22","first-page":"2366","article-title":"Depth map prediction from a single image using a multi-scale deep network","volume-title":"Proc. 28th Int. Conf. Neural Inf. Process. Syst.","author":"Eigen","year":"2014"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.01196"},{"key":"ref24","article-title":"ZoeDepth: Zero-shot transfer by combining relative and metric depth","author":"Bhat","year":"2023"},{"key":"ref25","first-page":"1","article-title":"Depth Pro: Sharp monocular metric depth in less than a second","volume-title":"Proc. Int. Conf. Learn. Representations","author":"Bochkovskii","year":"2025"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2025.3628473"},{"key":"ref27","article-title":"Depth Anything 3: Recovering the visual space from any views","author":"Lin","year":"2025"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.26599\/CVM.2025.9450517"},{"key":"ref29","first-page":"1","article-title":"Benchmarking neural network robustness to common corruptions and perturbations","volume-title":"Proc. Int. Conf. Learn. Representations","author":"Hendrycks","year":"2019"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2008.132"},{"key":"ref31","article-title":"Metamorphic Testing: A new approach for generating next test cases","author":"Chen","year":"1998"},{"key":"ref32","first-page":"191","article-title":"Application of metamorphic testing in numerical analysis","volume-title":"Proc. IASTED Int. Conf. Softw. Eng.","author":"Chan","year":"1998"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3708521"},{"key":"ref34","first-page":"1053","article-title":"Metamorphic object insertion for testing object detection systems","volume-title":"Proc. 35th IEEE\/ACM Int. Conf. Automated Softw. Eng.","author":"Wang","year":"2021"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICST62969.2025.10988919"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180220"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/MET59151.2023.00009"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00227"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-11015-4_25"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2025.113518"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33715-4_54"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/3DV.2017.00012"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3353042"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.02308"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/24\/11317936\/11606150.pdf?arnumber=11606150","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T19:01:48Z","timestamp":1784919708000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11606150\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/tr.2026.3711986","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}