{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T20:26:30Z","timestamp":1761596790461,"version":"3.38.0"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2002,11,1]],"date-time":"2002-11-01T00:00:00Z","timestamp":1036108800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2002,11]]},"DOI":"10.1109\/tse.2002.1049402","type":"journal-article","created":{"date-parts":[[2003,1,3]],"date-time":"2003-01-03T17:55:00Z","timestamp":1041616500000},"page":"1023-1038","source":"Crossref","is-referenced-by-count":94,"title":["Timed Wp-method: testing real-time systems"],"prefix":"10.1109","volume":"28","author":[{"given":"A.","family":"En-Nouaary","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Dssouli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Khendek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0032042"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0304-3975(94)90010-8"},{"article-title":"Fault Model in Testing","volume-title":"Proc. Fourth IFIP TC6 Int\u2019l Workshop Protocol Test System","author":"Bochmann","key":"ref3"},{"key":"ref4","first-page":"349","article-title":"LOTOS Specification, Their Implementations and Their Tests","volume-title":"Proc. Protocol Specification, Testing, and Verification, VI","author":"Brinksma"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-56496-9_24"},{"article-title":"Application des Hypoth\u00e9sde Test \u00e1 une D\u00e9finition de la Couverture","year":"1997","author":"Charles","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1978.231496"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/WORDS.1997.609955"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0055352"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1985.231845"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/0304-3975(84)90113-0"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/REAL.1996.563702"},{"article-title":"G\u00e9n\u00e9ration de Tests Temporis\u00e9s","volume-title":"Proc. Sixth Colloque Francophone de l\u2019ing\u00e9nierie des Protocoles","author":"En-Nouaary","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/real.1998.739748"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/RTCSA.1999.811206"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RTCSA.1999.811206"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-35516-0_19"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/32.87284"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-35567-2_13"},{"key":"ref20","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-35516-0_18","article-title":"An Approach for Testing Real-Time Protocols","volume-title":"TESTCOM","author":"Khoumsi"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/RTCSA.2000.896424"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/BF02252683"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/32.265636"},{"article-title":"Test Generation Based on an FSM Model with Timers and Counters","year":"1993","author":"Liu","key":"ref24"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1006\/inco.1997.2623"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tcom.1976.1093424"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/210223.210226"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45319-9_24"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/32.159837"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7552(88)90064-5"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-61648-9_38"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3975(99)00134-6"},{"key":"ref33","first-page":"18.5.1","article-title":"Introducing Real-Time Constraints into Requirements and High Level Design of Operating Systems","volume-title":"Proc. Nat\u2019l Telecomm. Conf.","volume":"1","author":"Taylor"},{"article-title":"A Formal Approach to Conformance Testing","year":"1992","author":"Tretmans","key":"ref34"},{"article-title":"Testing Labelled Transition Systems with Inputs and Outputs","year":"1995","author":"Tretmans","key":"ref35"},{"article-title":"On Test Coverage Metrics for Communication Protocols","volume-title":"Proc. Fourth Int\u2019l Workshop Protocol Test System (IWPTS \u201991)","author":"Vuong","key":"ref36"},{"article-title":"The UIOv Method for Protocol Test Sequence Generation","volume-title":"Proc. Second Int\u2019l Workshop Protocol Test System","author":"Vuong","key":"ref37"},{"issue":"4","key":"ref38","article-title":"Selecting Software Test Data Using Data Flow Information","volume":"11","author":"Weyuker","year":"1985","journal-title":"IEEE Trans. Software Eng."},{"article-title":"On the Development of Conformance Test Suites in View of Their Fault Coverage","year":"1995","author":"Yao","key":"ref39"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/32\/22485\/01049402.pdf?arnumber=1049402","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,16]],"date-time":"2025-03-16T04:40:28Z","timestamp":1742100028000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1049402\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,11]]},"references-count":39,"journal-issue":{"issue":"11","published-print":{"date-parts":[[2002,11]]}},"URL":"https:\/\/doi.org\/10.1109\/tse.2002.1049402","relation":{},"ISSN":["0098-5589"],"issn-type":[{"type":"print","value":"0098-5589"}],"subject":[],"published":{"date-parts":[[2002,11]]}}}