{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:52:09Z","timestamp":1772041929702,"version":"3.50.1"},"reference-count":64,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2014,7,1]],"date-time":"2014-07-01T00:00:00Z","timestamp":1404172800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2014,7,1]]},"DOI":"10.1109\/tse.2014.2327020","type":"journal-article","created":{"date-parts":[[2014,5,29]],"date-time":"2014-05-29T18:04:18Z","timestamp":1401386658000},"page":"650-670","source":"Crossref","is-referenced-by-count":174,"title":["Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines"],"prefix":"10.1109","volume":"40","author":[{"given":"Christopher","family":"Henard","sequence":"first","affiliation":[]},{"given":"Mike","family":"Papadakis","sequence":"additional","affiliation":[]},{"given":"Gilles","family":"Perrouin","sequence":"additional","affiliation":[]},{"given":"Jacques","family":"Klein","sequence":"additional","affiliation":[]},{"given":"Patrick","family":"Heymans","sequence":"additional","affiliation":[]},{"given":"Yves","family":"Le Traon","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2008.56"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/s13198-011-0067-4"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.8"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/1147249.1147257"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2011.31"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-79124-9_6"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/1294921.1294922"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2008.42"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1572272.1572296"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/1276958.1277173"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1145\/1960275.1960284"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1145\/2491627.2491635"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33666-9_18"},{"key":"ref63","year":"0","journal-title":"Standard for Software Component Testing"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-5571-3_8"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/32.707695"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-78743-3_2"},{"key":"ref29","first-page":"254","article-title":"In-parameter-order: A test generation strategy for pairwise testing","author":"lei","year":"0","journal-title":"Proc 3rd IEEE Int High-Assur Syst Eng Symp"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.is.2010.01.001"},{"key":"ref1","author":"clements","year":"2001","journal-title":"Software Product Lines Practices and Patterns"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2491627.2491646"},{"key":"ref22","author":"pohl","year":"0","journal-title":"Software Product Line Engineering - Foundations Principles and Techniques"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2430502.2430513"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985856"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2491411.2491455"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1273463.1273482"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-34691-0_5"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3975(01)00182-7"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025144"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.92"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985795"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2003.1251061"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.146"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1002\/stv.430"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1145\/1639950.1640002"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2009.52"},{"key":"ref52","article-title":"Sat-based analysis of feature models is easy","author":"mendon\u00e7a","year":"0","journal-title":"Proc 13th Int Softw Product Line Conf"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2010.43"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.85"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-010-9135-7"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.319"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1883612.1883618"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MITP.2008.54"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1806799.1806864"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2491411.2491436"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2110147.2110154"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2362536.2362547"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227129"},{"key":"ref4","article-title":"Testing a software product line","author":"mcgregor","year":"2007"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.21236\/ADA235785","article-title":"Feature-oriented domain analysis (foda) feasibility study","author":"kang","year":"1990"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2004.24"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/32.605761"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-011-9160-9"},{"key":"ref7","first-page":"196","article-title":"Automated incremental pairwise testing of software product lines","author":"oster","year":"0","journal-title":"Proc 14th Int Conf Softw Product Lines Going Beyond"},{"key":"ref49","first-page":"547","article-title":"Étude comparative de la distribution florale dans une portion des alpes et des jura","volume":"37","author":"jaccard","year":"1901","journal-title":"Bulletin del la Socit Vaudoise des Sciences Naturelles"},{"key":"ref9","first-page":"638","article-title":"Properties of realistic feature models make combinatorial testing of product lines feasible","author":"johansen","year":"0","journal-title":"Proc Int'l Conf Model Driven Eng Languages and Systems"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.12.003"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.05.011"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.9"},{"key":"ref47","doi-asserted-by":"crossref","first-page":"59","DOI":"10.3233\/SAT190075","article-title":"The sat4j library, release 2.2, system description","volume":"7","author":"berre","year":"2010","journal-title":"J Satisfiability Boolean Model Comput"},{"key":"ref42","first-page":"386","article-title":"An anytime approach to analyzing software systems","author":"rubenstein","year":"0","journal-title":"Proc 10th Int Florida Artif Intell Res Symp"},{"key":"ref41","first-page":"613","article-title":"Evolutionary search-based test generation for software product line feature models","author":"ensan","year":"0","journal-title":"Proc 24th Int Conf Adv Inf Syst Eng"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.167"},{"key":"ref43","first-page":"59","article-title":"The implications of variation for testing in a software product line","author":"mcgregor","year":"0","journal-title":"Proc 11th Int Conf Softw Product Lines"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/6848876\/06823132.pdf?arnumber=6823132","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:55:32Z","timestamp":1642006532000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6823132\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7,1]]},"references-count":64,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tse.2014.2327020","relation":{},"ISSN":["0098-5589","1939-3520"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,7,1]]}}}