{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T02:04:53Z","timestamp":1773021893608,"version":"3.50.1"},"reference-count":66,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2016,11,1]],"date-time":"2016-11-01T00:00:00Z","timestamp":1477958400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"name":"Next-Generation Information Computing Development Program"},{"DOI":"10.13039\/100007431","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007431","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004085","name":"Ministry of Education, Science and Technology","doi-asserted-by":"publisher","award":["2012M3C4A7033345"],"award-info":[{"award-number":["2012M3C4A7033345"]}],"id":[{"id":"10.13039\/501100004085","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2016,11,1]]},"DOI":"10.1109\/tse.2016.2550458","type":"journal-article","created":{"date-parts":[[2016,4,5]],"date-time":"2016-04-05T20:08:48Z","timestamp":1459886928000},"page":"1015-1035","source":"Crossref","is-referenced-by-count":53,"title":["Developer Micro Interaction Metrics for Software Defect Prediction"],"prefix":"10.1109","volume":"42","author":[{"given":"Taek","family":"Lee","sequence":"first","affiliation":[]},{"given":"Jaechang","family":"Nam","sequence":"additional","affiliation":[]},{"given":"Donggyun","family":"Han","sequence":"additional","affiliation":[]},{"given":"Sunghun","family":"Kim","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2277-8211","authenticated-orcid":false,"given":"Hoh","family":"Peter In","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICPC.2007.18"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2008.47"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12029-9_5"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/1453101.1453106"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9171-y"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227193"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICPC.2007.12"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICPC.2011.35"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2006.105"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/1181775.1181777"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2003.1245283"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606583"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606589"},{"key":"ref63","article-title":"Appropriate statistics for ordinal level data: Should we really be using t-test and Cohen's d for evaluating group differences on the NSSE and other surveys?","author":"romano","year":"2006","journal-title":"Annual Meeting of the Florida Association of Institutional Research"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/PROMISE.2007.10"},{"key":"ref64","article-title":"Quality is Free: The Art of Making Quality Certain","author":"crosby","year":"1979"},{"key":"ref27","first-page":"580","article-title":"Static analysis tools as early indicators of pre-release defect density","author":"nagappan","year":"0","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref65","article-title":"Studying just-in-time defect prediction using cross-project models","author":"kamei","year":"2015","journal-title":"Empirical Softw Eng"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.91"},{"key":"ref29","first-page":"284","article-title":"Use of relative code churn measures to predict system defect density","author":"nagappan","year":"0","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070510"},{"key":"ref1","author":"vahid","year":"2001","journal-title":"Embedded System Design A Unified Hardware\/Software Introduction"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvlc.2004.08.003"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1540438.1540448"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1052898.1052912"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/32.544352"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025156"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2005.112"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1191795"},{"key":"ref50","first-page":"379","article-title":"Feature engineering for text classification","author":"scott","year":"0","journal-title":"Proc 16th Int Conf Mach Learning"},{"key":"ref51","first-page":"121","article-title":"Fair and balanced? bias in bug-fix datasets","author":"bird","year":"0","journal-title":"Proc 7th Joint Meet Eur Softw Eng Conf ACM SIGSOFT Symp Found Softw Eng"},{"key":"ref59","article-title":"Correlation-based feature selection for machine learning","author":"hall","year":"1998","journal-title":"Dept of Computer Science University of Waikato"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.20"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2009.76"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2010.18"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.06.055"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-010-0069-5"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-008-9080-x"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025157"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.81"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2010.5463279"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICPC.2010.46"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2008.35"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/32.295895"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/32.553637"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368114"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2011.24"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"494","DOI":"10.1037\/0033-2909.114.3.494","article-title":"Dominance statistics: Ordinal analyses to answer ordinal questions","volume":"114","author":"norman","year":"1993","journal-title":"Psychological Bulletin"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1134285.1134355"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-010-9104-9"},{"key":"ref4","first-page":"489","article-title":"Predicting faults from cached history","author":"kim","year":"0","journal-title":"Proc 29th Int'l Conf Software Eng"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70773"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1134285.1134349"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.256941"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2009.5306304"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2005.49"},{"key":"ref49","author":"alpaydin","year":"2010","journal-title":"Introduction to Machine Learning"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368161"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2000.883028"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1145\/1656274.1656278"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025119"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/1083142.1083147"},{"key":"ref42","first-page":"18","article-title":"Classification and regression by randomforest","volume":"2","author":"liaw","year":"2002","journal-title":"R News"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227220"},{"key":"ref44","author":"walpole","year":"2006","journal-title":"Probability & Statistics for Engineers & Scientists"},{"key":"ref43","article-title":"The goal question metric approach","author":"basili","year":"1994","journal-title":"Chapter in Encyclopedia of Software Engineering"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/7741038\/07447797.pdf?arnumber=7447797","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:27:02Z","timestamp":1642004822000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7447797\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11,1]]},"references-count":66,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tse.2016.2550458","relation":{},"ISSN":["0098-5589","1939-3520"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,11,1]]}}}