{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:59:39Z","timestamp":1740131979485,"version":"3.37.3"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2017,12,1]],"date-time":"2017-12-01T00:00:00Z","timestamp":1512086400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"National Institute of Technology Meghalaya and Visvesvaraya Ph.D. Scheme"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2017,12,1]]},"DOI":"10.1109\/tse.2017.2654251","type":"journal-article","created":{"date-parts":[[2017,1,17]],"date-time":"2017-01-17T19:54:31Z","timestamp":1484682871000},"page":"1110-1124","source":"Crossref","is-referenced-by-count":15,"title":["AutoSense: A Framework for Automated Sensitivity Analysis of Program Data"],"prefix":"10.1109","volume":"43","author":[{"given":"Bernard","family":"Nongpoh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7990-6416","authenticated-orcid":false,"given":"Rajarshi","family":"Ray","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Saikat","family":"Dutta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0220-646X","authenticated-orcid":false,"given":"Ansuman","family":"Banerjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/1806596.1806620"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1297027.1297055"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1993498.1993518"},{"article-title":"Scimark 2.0.","year":"0","author":"pozo","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2012.48"},{"journal-title":"Sensitivity Analysis in Practice A Guide to Assessing Scientific Models","year":"2004","author":"saltelli","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2015.13"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2004.1281665"},{"article-title":"Verification and planning for stochastic processes with\n asynchronous events","year":"2005","author":"younes","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45657-0_17"},{"journal-title":"Advanced Engineering Mathematics","year":"2006","author":"kreyszig","key":"ref18"},{"article-title":"Hypothesis testing. from mathworld–a wolfram web resource.","year":"0","author":"weisstein","key":"ref19"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/1183401.1183447"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228525"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025133"},{"key":"ref3","first-page":"56","article-title":"Cramming more components onto integrated circuits","author":"moore","year":"2000","journal-title":"Readings in Computer Architecture"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1831708.1831713"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/1297027.1297055"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2544173.2509546"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2597809.2597812"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488873"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2751163"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1993498.1993518"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2666356.2604001"},{"journal-title":"Testing Statistical Hypotheses","year":"2005","author":"lehmann","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177731118"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-16612-9_11"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11957-6_5"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-03811-6"},{"year":"0","key":"ref26","article-title":"Java instrumentation library"},{"article-title":"Bcel: Byte code engineering library","year":"0","author":"commons","key":"ref25"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/8170602\/07820185.pdf?arnumber=7820185","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:24:56Z","timestamp":1642004696000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7820185\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12,1]]},"references-count":31,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tse.2017.2654251","relation":{},"ISSN":["0098-5589","1939-3520"],"issn-type":[{"type":"print","value":"0098-5589"},{"type":"electronic","value":"1939-3520"}],"subject":[],"published":{"date-parts":[[2017,12,1]]}}}