{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T15:40:10Z","timestamp":1778168410385,"version":"3.51.4"},"reference-count":54,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2018,1,1]]},"DOI":"10.1109\/tse.2017.2659747","type":"journal-article","created":{"date-parts":[[2017,1,26]],"date-time":"2017-01-26T21:10:04Z","timestamp":1485465004000},"page":"5-24","source":"Crossref","is-referenced-by-count":102,"title":["A Developer Centered Bug Prediction Model"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3861-1902","authenticated-orcid":false,"given":"Dario","family":"Di Nucci","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9337-5116","authenticated-orcid":false,"given":"Fabio","family":"Palomba","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giuseppe","family":"De Rosa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2216-3148","authenticated-orcid":false,"given":"Gabriele","family":"Bavota","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7995-8582","authenticated-orcid":false,"given":"Rocco","family":"Oliveto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4238-1425","authenticated-orcid":false,"given":"Andrea","family":"De Lucia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","first-page":"124","article-title":"The alternating decision tree learning algorithm","author":"mason","year":"1999","journal-title":"Proc 16th Int Conf Mach Learn"},{"key":"ref38","author":"baeza-yates","year":"1999","journal-title":"Modern Information Retrieval"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2007.66"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2005.91"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2003.1287243"},{"key":"ref30","first-page":"284","article-title":"Use of relative code churn measures to predict system defect density","author":"nagappan","year":"2005","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-012-9226-8"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/32.295895"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1146238.1146246"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.25"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/METRIC.2003.1232479"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1191795"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.11.704"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2005.112"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/32.544352"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025119"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606591"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/SCAM.2012.20"},{"key":"ref24","author":"basili","year":"1994","journal-title":"The Goal Question Metric Paradigm"},{"key":"ref23","first-page":"241","article-title":"On the role of developer's scattered changes in bug prediction","author":"nucci","year":"2015","journal-title":"31st International Conference on Software Maintenance and Evolution"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"63","DOI":"10.1016\/S0164-1212(00)00086-8","article-title":"The\n prediction of faulty classes using object-oriented design metrics","volume":"56","author":"melo","year":"2001","journal-title":"J Syst Softw"},{"key":"ref25","article-title":"A developer centered bug prediction model-replication package","author":"nucci","year":"2016"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595716"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2013.6624018"},{"key":"ref54","author":"devijver","year":"1982","journal-title":"Pattern Recognition a Statistical Approach"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1002\/0470013192.bsa501"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2013.39"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1868328.1868357"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1414004.1414063"},{"key":"ref40","first-page":"174","article-title":"The power of decision tables","author":"kohavi","year":"1995","journal-title":"Proc Eur Conf Mach Learn"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2020390.2020392"},{"key":"ref13","first-page":"181","article-title":"A\n comparative analysis of the efficiency of change metrics and static code attributes for defect prediction","author":"pedrycz","year":"2008","journal-title":"Proc Int Conf Softw Eng"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1134285.1134349"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9173-9"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1083142.1083147"},{"key":"ref17","first-page":"153","article-title":"Do time of day and developer\n experience affect commit bugginess?","author":"tan","year":"2011","journal-title":"Proc 8th Working Conf Mining Softw Repositories"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985860"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"181","DOI":"10.1109\/TSE.2007.70773","article-title":"Classifying\n software changes: Clean or buggy?","volume":"34","author":"whitehead","year":"2008","journal-title":"IEEE Trans Softw Eng"},{"key":"ref4","first-page":"580","article-title":"Static analysis tools as early indicators of pre-release defect density","author":"nagappan","year":"2005","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/32.553637"},{"key":"ref6","first-page":"364","article-title":"Detection of software modules with high\n debug code churn in a very large legacy system","author":"taghi","year":"1996","journal-title":"Proc 7th IEEE Int Symp Softw Reliab Eng"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PROMISE.2007.10"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070510"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"653","DOI":"10.1109\/32.859533","article-title":"Predicting fault incidence\n using software change history","volume":"26","author":"marron","year":"2000","journal-title":"IEEE Trans Softw Eng"},{"key":"ref49","author":"grissom","year":"2005","journal-title":"Effect Sizes for Research A Broad Practical Approach"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9178-4"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/S0004-3702(97)00043-X"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2001.957806"},{"key":"ref48","author":"conover","year":"1998","journal-title":"Practical Nonparametric Statistics"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/WPC.1998.693283"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.21236\/AD0256582"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.2307\/2347628"},{"key":"ref44","article-title":"The promise repository of empirical software\n engineering data","author":"menzies","year":"0"},{"key":"ref43","first-page":"338","article-title":"Estimating continuous distributions in Bayesian classifiers","author":"john","year":"1995","journal-title":"Proc 11th Conf Uncertainty Artif Intell"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/8249562\/07835258.pdf?arnumber=7835258","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,25]],"date-time":"2022-01-25T22:16:09Z","timestamp":1643148969000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7835258\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,1,1]]},"references-count":54,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tse.2017.2659747","relation":{},"ISSN":["0098-5589","1939-3520"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,1,1]]}}}