{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T08:08:37Z","timestamp":1770883717783,"version":"3.50.1"},"reference-count":58,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Information & communications Technology Promotion (IITP)"},{"name":"Korea government (MSIP)","award":["R0126-17-1101"],"award-info":[{"award-number":["R0126-17-1101"]}]},{"name":"Software R&D for Model-based Analysis and Verification of Higher-order Large Complex System"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2018,10,1]]},"DOI":"10.1109\/tse.2017.2732347","type":"journal-article","created":{"date-parts":[[2017,7,27]],"date-time":"2017-07-27T18:09:05Z","timestamp":1501178945000},"page":"914-931","source":"Crossref","is-referenced-by-count":28,"title":["A Theoretical and Empirical Study of Diversity-Aware Mutation Adequacy Criterion"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0840-6449","authenticated-orcid":false,"given":"Donghwan","family":"Shin","sequence":"first","affiliation":[]},{"given":"Shin","family":"Yoo","sequence":"additional","affiliation":[]},{"given":"Doo-Hwan","family":"Bae","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-013-9299-z"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2012.31"},{"key":"ref33","doi-asserted-by":"crossref","first-page":"248","DOI":"10.1109\/32.491648","article-title":"A formal analysis of the subsume relation between software test adequacy\n criteria","volume":"22","author":"zhu","year":"1996","journal-title":"IEEE Trans Softw Eng"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2014.20"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10270-014-0428-y"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"733","DOI":"10.1109\/TSE.2006.92","article-title":"On the use of mutation faults in empirical assessments of test case prioritization techniques","volume":"32","author":"do","year":"2006","journal-title":"IEEE Trans Softw Eng"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.07.009"},{"key":"ref36","first-page":"936","article-title":"Trivial compiler equivalence: a large scale empirical study of a simple, fast and effective equivalent mutant detection technique","author":"papadakis","year":"2015","journal-title":"Proceedings of the International Conference on Software Engineering ICSE'94"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2013.44"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/BF00625279"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/567446.567468"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/WST.1988.5370"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/125489.125473"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2005.45"},{"key":"ref1","first-page":"320","article-title":"Adaptive\n random testing","author":"chen","year":"2004","journal-title":"Proc Asian Computer Science Conf"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628055"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2009.30"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.83"},{"key":"ref24","first-page":"654","article-title":"Are mutants a valid substitute for real faults in software testing?","author":"just","year":"2014","journal-title":"Symp on Found of Soft Eng"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025144"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/32.57623"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2016.22"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1486"},{"key":"ref51","first-page":"146","article-title":"Using model checking to generate tests from requirements specifications","author":"gargantini","year":"1999","journal-title":"Proc Eur Softw Eng Conf Held Jointly Symp Found Softw Eng"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.14"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1145\/1134285.1134299"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2016.04.009"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2610388"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2010.42"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.294"},{"key":"ref52","first-page":"209","article-title":"KLEE:\n Unassisted and automatic generation of high-coverage tests for complex systems programs","volume":"8","author":"cadar","year":"2008","journal-title":"Proc 8th USENIX Conf Operating Syst Des Implementation"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/227607.227610"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1379","DOI":"10.1016\/j.infsof.2009.04.016","article-title":"Higher order mutation testing","volume":"51","author":"jia","year":"2009","journal-title":"Inf Softw Technol"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1471"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.39"},{"key":"ref13","article-title":"Mutation clustering","author":"hussain","year":"2008"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2016.01.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2012.08.024"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2014.13"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1561"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/C-M.1978.218136"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2016.37"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2610413"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1572272.1572296"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2016.33"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2008.36"},{"key":"ref8","article-title":"On mutation","author":"acree","year":"1980"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/32.238581"},{"key":"ref9","article-title":"Mutation analysis of program test data","author":"budd","year":"1980"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2015.86"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.1994.296778"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2003.1201188"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368136"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628053"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2016.18"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025179"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1145\/1297846.1297902"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/8491898\/07994647.pdf?arnumber=7994647","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T20:37:00Z","timestamp":1643229420000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7994647\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10,1]]},"references-count":58,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tse.2017.2732347","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,10,1]]}}}