{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T17:11:54Z","timestamp":1781889114322,"version":"3.54.5"},"reference-count":55,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2018,12,1]]},"DOI":"10.1109\/tse.2017.2766070","type":"journal-article","created":{"date-parts":[[2017,10,24]],"date-time":"2017-10-24T18:19:56Z","timestamp":1508869196000},"page":"1207-1223","source":"Crossref","is-referenced-by-count":55,"title":["Entropy Based Software Reliability Analysis of Multi-Version Open Source Software"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9601-7039","authenticated-orcid":false,"given":"V.B.","family":"Singh","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Meera","family":"Sharma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hoang","family":"Pham","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2207531"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/IEEM.2009.5373378"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3233\/HIS-2004-11-212"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISESE.2003.1237987"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2003.07.002"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2015.01.043"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.859230"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1080\/00207729108910731"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/s13198-014-0226-5"},{"key":"ref34","article-title":"Qualitative software complexity models: A summary","author":"baisli","year":"1980","journal-title":"Tutorial on Models and Methods for Software Management and Engineering"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(98)00103-3"},{"key":"ref27","author":"goldberg","year":"1989","journal-title":"Genetic Algorithms in Search Optimization and Machine Learning"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/24.387368"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221735"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"ref20","doi-asserted-by":"crossref","DOI":"10.1142\/1390","author":"xie","year":"1991","journal-title":"Software Reliability Modeling"},{"key":"ref22","author":"pham","year":"2000","journal-title":"Software Reliability"},{"key":"ref21","author":"lyu","year":"1996","journal-title":"Handbook of Software Reliability Engineering"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/00207720802556245"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539308002915"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2016.02.034"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.05.001"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539310003974"},{"key":"ref51","doi-asserted-by":"crossref","DOI":"10.1007\/978-4-431-54565-1","author":"yamada","year":"2014","journal-title":"Software Reliability Modeling Fundamentals and Applications"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539313500125"},{"key":"ref54","first-page":"431","article-title":"Two dimensional flexible\n software reliability growth model and related release policy","author":"kapur","year":"0","journal-title":"Proc 4th Nat Conf Comput Nation Develop INDIACom-2010"},{"key":"ref53","doi-asserted-by":"crossref","DOI":"10.1142\/4011","author":"kapur","year":"1999","journal-title":"Contributions to Hardware and Software Reliability"},{"key":"ref52","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-319-31818-9","author":"yamada","year":"2016","journal-title":"OSS Reliability Measurement and Assessment"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1595782.1595793"},{"key":"ref11","author":"raymond","year":"2001","journal-title":"The Cathedral and the Bazaar"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2014.09.103"},{"key":"ref12","first-page":"1","article-title":"Factors impacting software release engineering: A longitudinal study","author":"kerzazi","year":"0","journal-title":"Proc 2nd Workshop Release Eng"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606779"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2015.55"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70739"},{"key":"ref16","first-page":"209","article-title":"Entropy as a measure of uncertainty in software reliability","author":"kamavaram","year":"0","journal-title":"Proc 13th Int l Symp Software Reliability Eng"},{"key":"ref17","first-page":"78","article-title":"Predicting faults based on complexity of code change","author":"hassan","year":"0","journal-title":"Proc Int Conf Softw Eng"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSREW.2014.95"},{"key":"ref19","article-title":"McGraw-Hill","author":"musa","year":"1987","journal-title":"Software Reliability Measurement Prediction Application"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1109\/MS.2004.1259206","article-title":"The many meanings of open source","volume":"21","author":"cristina","year":"2004","journal-title":"IEEE Softw"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.04.005"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1201\/EBK0849326202"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2009.11.006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2015.54"},{"key":"ref7","author":"raymond","year":"1997","journal-title":"The Cathedral and the Bazaar Musings on Linux and Open Source by an Accidental Revolutionary"},{"key":"ref49","first-page":"123","article-title":"IEEE Standard Dictionary of Measures to Produce Reliable Software","author":"chen","year":"1989","journal-title":"Linear Networks and Systems"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227099"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539317500036"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539317500012"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1948.tb01338.x"},{"key":"ref47","author":"varian","year":"1991","journal-title":"Intermediate Microeconomics A Modern Approach"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2013.827261"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2014.12.029"},{"key":"ref44","first-page":"260","article-title":"NHPP-based software reliability model considering testing effort and multivariate fault detection rate","volume":"27","author":"zhang","year":"2016","journal-title":"Journal of Systems Engineering and Electronics"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2016.01.025"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/8571058\/08081836.pdf?arnumber=8081836","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T03:04:55Z","timestamp":1643252695000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8081836\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12,1]]},"references-count":55,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tse.2017.2766070","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,12,1]]}}}