{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T05:10:36Z","timestamp":1769749836023,"version":"3.49.0"},"reference-count":154,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100008982","name":"National Science Foundation","doi-asserted-by":"publisher","award":["#1506586"],"award-info":[{"award-number":["#1506586"]}],"id":[{"id":"10.13039\/501100008982","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008982","name":"National Science Foundation","doi-asserted-by":"publisher","award":["#1302169"],"award-info":[{"award-number":["#1302169"]}],"id":[{"id":"10.13039\/501100008982","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2019,11,1]]},"DOI":"10.1109\/tse.2018.2821670","type":"journal-article","created":{"date-parts":[[2018,4,2]],"date-time":"2018-04-02T20:39:03Z","timestamp":1522701543000},"page":"1081-1105","source":"Crossref","is-referenced-by-count":55,"title":["Bellwethers: A Baseline Method for Transfer Learning"],"prefix":"10.1109","volume":"45","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5899-6651","authenticated-orcid":false,"given":"Rahul","family":"Krishna","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5040-3196","authenticated-orcid":false,"given":"Tim","family":"Menzies","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/32.544352"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/1159733.1159738"},{"key":"ref33","author":"lanza","year":"2006","journal-title":"Object-Oriented Metrics in Practice Using Software Metrics to Characterize Evaluate and Improve the Design of Object-Oriented Systems"},{"key":"ref32","author":"kerievsky","year":"2005","journal-title":"Refactoring to Patterns"},{"key":"ref31","author":"fowler","year":"1999","journal-title":"Refactoring Improving the Design of Existing Code"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2009.5069480"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/spip.389"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.1015"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2013.6671299"},{"key":"ref34","article-title":"SonarQube: Open source quality management","author":"campbell","year":"2015"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.12.008"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.45"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.1001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.09.007"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786852"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-014-9346-4"},{"key":"ref24","author":"cohen","year":"1995","journal-title":"Empirical Methods for Artificial Intelligence"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/4235.585893"},{"key":"ref101","article-title":"Less is more: Minimizing code reorganization using XTREE","author":"krishna","year":"2016"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2738037"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1145\/1985362.1985366"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1023\/A:1022631118932"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.12.794"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2001.914976"},{"key":"ref154","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2013.20"},{"key":"ref153","first-page":"101","article-title":"A critique and improvement of the CL common language effect size statistics of McGraw and Wong","volume":"25","author":"vargha","year":"2000","journal-title":"Journal of Educational and Behavioral Statistics"},{"key":"ref150","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.12.008"},{"key":"ref152","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606637"},{"key":"ref151","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2007.02.015"},{"key":"ref146","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-4541-9"},{"key":"ref147","first-page":"1","article-title":"A call for greater use of nonparametric statistics","author":"leech","year":"2002","journal-title":"The Annual Meeting of the Mid-South Educational Research Association"},{"key":"ref148","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.24"},{"key":"ref149","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985795"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/32.935855"},{"key":"ref58","article-title":"Validating object-oriented design metrics on a commercial JAVA application","author":"glasberg","year":"2000","journal-title":"National Research Council of Canada"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-009-9079-6"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.9"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1145\/1540438.1540462"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2005.12.002"},{"key":"ref53","first-page":"1","article-title":"An empirical evaluation of object oriented metrics in industrial setting","author":"denaro","year":"2003","journal-title":"5th CaberNet Plenary Workshop"},{"key":"ref52","first-page":"621","article-title":"Predicting faulty classes using design metrics with discriminant analysis","author":"thongmak","year":"2003","journal-title":"Software Engineering Research and Practice"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(99)00102-8"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SEAA.2011.59"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70721"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2568225.2568233"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.27"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"31","DOI":"10.1109\/MS.2013.86","article-title":"Software analytics: So what?","volume":"30","author":"zimmermann","year":"2013","journal-title":"IEEE Softw"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-COMPANION.2009.5070975"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.148"},{"key":"ref9","author":"bird","year":"2015","journal-title":"The Art and Science of Analyzing Software Data"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1191795"},{"key":"ref45","first-page":"99","article-title":"Predicting fault-proneness using OO metrics an industrial case study","author":"yu","year":"2002","journal-title":"Proc European Conf Software Maintenance and Reeng"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2005.112"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.102"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/32.879814"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009815306478"},{"key":"ref44","doi-asserted-by":"crossref","first-page":"242","DOI":"10.1109\/METRIC.1999.809745","article-title":"An empirical study on object-oriented metrics","author":"tang","year":"1999","journal-title":"Proc 6th Int l Software Metrics Symp"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(00)00086-8"},{"key":"ref127","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025120"},{"key":"ref126","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9173-9"},{"key":"ref125","author":"rakitin","year":"2001","journal-title":"Software Verification and Validation for Practitioners and Managers"},{"key":"ref124","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606583"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/ICTAI.2010.27"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-011-0092-1"},{"key":"ref129","doi-asserted-by":"publisher","DOI":"10.1109\/32.553637"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1145\/1540438.1540448"},{"key":"ref128","doi-asserted-by":"publisher","DOI":"10.1109\/32.544352"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2259203"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1145\/1390817.1390822"},{"key":"ref130","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985859"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884857"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2009.13"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.91"},{"key":"ref133","doi-asserted-by":"publisher","DOI":"10.1109\/NAFIPS.2007.383813"},{"key":"ref134","doi-asserted-by":"publisher","DOI":"10.1613\/jair.953"},{"key":"ref131","doi-asserted-by":"publisher","DOI":"10.1145\/1868328.1868342"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2016.04.017"},{"key":"ref132","doi-asserted-by":"crossref","first-page":"5","DOI":"10.1023\/A:1010933404324","article-title":"Random forests","author":"breiman","year":"2001","journal-title":"Mach Learn"},{"key":"ref79","author":"quionero-candela","year":"2009","journal-title":"Dataset Shift in Machine Learning"},{"key":"ref136","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2016.01.003"},{"key":"ref135","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.12.008"},{"key":"ref138","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70773"},{"key":"ref137","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2016.04.017"},{"key":"ref60","doi-asserted-by":"crossref","first-page":"571","DOI":"10.3844\/jcssp.2008.571.577","article-title":"Software defects and object oriented metrics-an empirical analysis","volume":"4","author":"thapaliyal","year":"2008","journal-title":"J Comput Sci"},{"key":"ref139","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884804"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(02)00024-9"},{"key":"ref61","first-page":"571","article-title":"An empirical validation of object-oriented design metrics for fault prediction","author":"capretz","year":"2008","journal-title":"J Comput Sci"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2008.35"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.103"},{"key":"ref140","first-page":"66","article-title":"C4. 5 and imbalanced data sets: Investigating the effect of sampling method, probabilistic estimate, and decision tree structure","author":"chawla","year":"2003","journal-title":"Proceedings of the ICML'03 Workshop on Class Imbalances"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.07.040"},{"key":"ref141","first-page":"179","article-title":"Addressing the curse of imbalanced training sets: One-sided selection","author":"kubat","year":"1997","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-010-0069-5"},{"key":"ref142","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.9"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.05.035"},{"key":"ref143","doi-asserted-by":"publisher","DOI":"10.1109\/PROMISE.2007.1"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2013.02.009"},{"key":"ref144","article-title":"A proof of the arithmetic mean-geometric mean-harmonic mean inequalities","volume":"2","author":"xia","year":"1999","journal-title":"RGMIA Res Rep Collection"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1007512.1007524"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-008-9079-3"},{"key":"ref145","doi-asserted-by":"publisher","DOI":"10.1038\/embor.2012.36"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2011.24"},{"key":"ref109","doi-asserted-by":"publisher","DOI":"10.1145\/1808920.1808933"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2007.45"},{"key":"ref108","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2007.25"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.1001"},{"key":"ref107","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2010.46"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2004.1274041"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-015-9378-4"},{"key":"ref92","article-title":"Simple software cost estimation: Safe or unsafe?","author":"menzies","year":"2005","journal-title":"Proceedings of the International Workshop on Predictive Models in Software Engineering"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1109\/IWSC.2012.6227872"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9182-8"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2010.11.921"},{"key":"ref90","first-page":"343","article-title":"Local versus global models for effort estimation and defect prediction","author":"menzies","year":"2011","journal-title":"Proc 26th IEEE\/ACM Int Conf Automated Softw Eng"},{"key":"ref103","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2009.47"},{"key":"ref102","doi-asserted-by":"publisher","DOI":"10.1016\/j.entcs.2005.02.059"},{"key":"ref111","first-page":"1","article-title":"Better predictors for issue lifetime","volume":"abs 1702 7735","author":"rees-jones","year":"2017","journal-title":"CoRR"},{"key":"ref112","doi-asserted-by":"publisher","DOI":"10.1145\/2020390.2020404"},{"key":"ref110","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606654"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2013.05.007"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606614"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1109\/ISESE.2005.1541858"},{"key":"ref97","first-page":"1","article-title":"Towards building a universal defect prediction model with rank transformed predictors","author":"zhang","year":"2015","journal-title":"Empirical Softw Eng"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606584"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786814"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"496","DOI":"10.1145\/2786805.2786813","article-title":"Heterogeneous cross-company defect prediction by unified metric representation and CCA-based transfer learning categories and subject descriptors","author":"jing","year":"2015","journal-title":"Proc 10th Joint Meet Eur Softw Eng Conf ACM SIGSOFT Symp Found Softw Eng"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2011.34"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-014-9300-5"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-008-9103-7"},{"key":"ref118","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.256941"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.92"},{"key":"ref82","article-title":"Better data” is better than “better data miners” (benefits of tuning SMOTE for defect prediction)","author":"agrawal","year":"2017","journal-title":"CoRR"},{"key":"ref117","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2002.1115012"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595713"},{"key":"ref81","first-page":"2","article-title":"When training and test sets are different: Characterizing learning transfer","author":"storkey","year":"2008","journal-title":"Dataset Shift in Machine Learning"},{"key":"ref18","first-page":"343","article-title":"Local versus global models for effort estimation and defect prediction","author":"menzies","year":"2011","journal-title":"Proc 26th IEEE\/ACM Int Conf Automated Softw Eng"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2004.1357825"},{"key":"ref119","first-page":"1748","article-title":"AI-based software defect predictors: Applications and benefits in a case study","author":"tosun","year":"2010","journal-title":"Proc 22nd Conf Artif Intell"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2970276.2970339"},{"key":"ref83","first-page":"403","article-title":"When and why your code starts to smell bad","author":"tufano","year":"2015","journal-title":"Proceedings of the International Conference on Software Engineering ICSE'94"},{"key":"ref114","author":"boehm","year":"1981","journal-title":"Software Engineering Economics"},{"key":"ref113","first-page":"1","article-title":"Negative results for software effort estimation","author":"menzies","year":"2016","journal-title":"Empirical Softw Eng"},{"key":"ref116","first-page":"580","article-title":"Static analysis tools as early indicators of pre-release defect density","author":"nagappan","year":"2005","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1214\/088342306000000060"},{"key":"ref115","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.1998.732690"},{"key":"ref120","doi-asserted-by":"publisher","DOI":"10.1145\/1540438.1540453"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595713"},{"key":"ref121","doi-asserted-by":"publisher","DOI":"10.1109\/METRIC.2002.1011343"},{"key":"ref122","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-59412-0_35"},{"key":"ref123","doi-asserted-by":"publisher","DOI":"10.1145\/2568225.2568269"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.89"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2011.63"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2009.2"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884812"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/8897053\/08329264.pdf?arnumber=8329264","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,17]],"date-time":"2022-08-17T20:55:49Z","timestamp":1660769749000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8329264\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11,1]]},"references-count":154,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tse.2018.2821670","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,11,1]]}}}