{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,28]],"date-time":"2026-04-28T00:34:40Z","timestamp":1777336480043,"version":"3.51.4"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Plan","award":["2018YFB1003800"],"award-info":[{"award-number":["2018YFB1003800"]}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CNS-1748109"],"award-info":[{"award-number":["CNS-1748109"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000180","name":"U.S. Department of Homeland Security","doi-asserted-by":"publisher","award":["DHS-14-ST-062-001"],"award-info":[{"award-number":["DHS-14-ST-062-001"]}],"id":[{"id":"10.13039\/100000180","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000161","name":"National Institute of Standards and Technology","doi-asserted-by":"publisher","award":["70NANB15H199"],"award-info":[{"award-number":["70NANB15H199"]}],"id":[{"id":"10.13039\/100000161","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2020,2,1]]},"DOI":"10.1109\/tse.2018.2844259","type":"journal-article","created":{"date-parts":[[2018,6,5]],"date-time":"2018-06-05T19:28:04Z","timestamp":1528226884000},"page":"141-162","source":"Crossref","is-referenced-by-count":16,"title":["Identifying Failure-Causing Schemas in the Presence of Multiple Faults"],"prefix":"10.1109","volume":"46","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5786-0894","authenticated-orcid":false,"given":"Xintao","family":"Niu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Changhai","family":"Nie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1069-5980","authenticated-orcid":false,"given":"Jeff Y.","family":"Lei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hareton","family":"Leung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9079-5534","authenticated-orcid":false,"given":"Xiaoyin","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","first-page":"439","article-title":"Program slicing","author":"weiser","year":"1981","journal-title":"5th Int Conf on Software Engineering"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2013.22"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2003.1251061"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.65"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/2499370.2462173"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.99"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2017.12"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2004.843247"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1656274.1656278"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/1273463.1273482"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2001.919107"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/310663.310667"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/503271.503243"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/32.605761"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227129"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2008.50"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1572272.1572294"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2015.7107441"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1273463.1273468"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/1143844.1143983"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/167049.167076"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2003.1201224"},{"key":"ref50","article-title":"Handling constraints in the input space when using combination strategies for software testing","author":"grindal","year":"2006"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2010.40"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.8"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001460"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/2000791.2000795"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-78773-0_44"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001450"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2013.53"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1883612.1883618"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2010.36"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2012.28"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2013.38"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TAIC.PART.2007.17"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2003.1201186"},{"key":"ref3","first-page":"146","article-title":"A framework of greedy methods for constructing interaction test suites","author":"bryce","year":"2005","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.117"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.381"},{"key":"ref8","first-page":"180","article-title":"Pairwise testing: A best practice that isn't","author":"bach","year":"2004","journal-title":"Proc Pacific Northwest Software Quality Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10878-007-9082-4"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-79124-9_6"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2000799.2000801"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1145\/2491411.2491436"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.149"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2006.03.004"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-010-9135-7"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/32.988498"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/11428862_179"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2013.6698916"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1137\/080730706"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/32\/8995665\/8372636-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/8995665\/08372636.pdf?arnumber=8372636","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:34:38Z","timestamp":1651070078000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8372636\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,2,1]]},"references-count":51,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tse.2018.2844259","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,2,1]]}}}