{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T15:44:36Z","timestamp":1784303076797,"version":"3.55.0"},"reference-count":59,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000161","name":"National Institute of Standards and Technology","doi-asserted-by":"publisher","award":["70NANB12H175"],"award-info":[{"award-number":["70NANB12H175"]}],"id":[{"id":"10.13039\/100000161","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000161","name":"National Institute of Standards and Technology","doi-asserted-by":"publisher","award":["70NANB10H168"],"award-info":[{"award-number":["70NANB10H168"]}],"id":[{"id":"10.13039\/100000161","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000161","name":"National Institute of Standards and Technology","doi-asserted-by":"publisher","award":["70NANB15H199"],"award-info":[{"award-number":["70NANB15H199"]}],"id":[{"id":"10.13039\/100000161","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2020,6,1]]},"DOI":"10.1109\/tse.2018.2865935","type":"journal-article","created":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T18:55:27Z","timestamp":1534532127000},"page":"616-645","source":"Crossref","is-referenced-by-count":34,"title":["A Combinatorial Testing-Based Approach to Fault Localization"],"prefix":"10.1109","volume":"46","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7261-5571","authenticated-orcid":false,"given":"Laleh","family":"Sh. Ghandehari","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1069-5980","authenticated-orcid":false,"given":"Yu","family":"Lei","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Raghu","family":"Kacker","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0050-1596","authenticated-orcid":false,"given":"Richard","family":"Kuhn","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tao","family":"Xie","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Kung","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2015.2421279"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/2491411.2491436"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/1883612.1883618"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/WCSE.2013.19"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2010.5609542"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2012.28"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1509"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2364175"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2015.2442577"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2000799.2000801"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786880"},{"key":"ref27","first-page":"177","article-title":"A learning-to-rank based fault localization approach using likely invariants","author":"le","year":"0","journal-title":"Proc 25th Int Symp Softw Testing Anal"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.381"},{"key":"ref2","year":"0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2006.18"},{"key":"ref20","year":"2015"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884791"},{"key":"ref21","year":"2015"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/581396.581397"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101949"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2004.24"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/SEW.2006.26"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-014-0165-z"},{"key":"ref59","first-page":"91","article-title":"A note on test oracles and semantics of algebraic specifications","author":"zhu","year":"0","journal-title":"Proc Int Conf Quality Softw"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227210"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001460"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/32.988498"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1145\/2491509.2491513"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.8"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME.2014.41"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635906"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SEW.2005.33"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-005-3861-2"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2003.1240292"},{"key":"ref12","year":"0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.scico.2007.01.015"},{"key":"ref14","year":"0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2013.47"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2014.8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2015.7107446"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2013.6698916"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.117"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2372785"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2009.87"},{"key":"ref6","first-page":"591","article-title":"T-way testing of ACTS: A case study","author":"borazjany","year":"0","journal-title":"Proc IEEE Int'l Conf Software Testing Verification and Validation"},{"key":"ref5","year":"0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/32.605761"},{"key":"ref7","year":"0"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2010.36"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2003.1201186"},{"key":"ref46","year":"0"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/11428862_179"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1142\/S021853930100058X"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/3092703.3092717"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2013.6693093"},{"key":"ref41","first-page":"309","article-title":"Isolating failure causes through test case generation","author":"r\u00f6?ler","year":"0","journal-title":"Proc Int'l Symp on Softw Testing and Analysis"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ISESE.2004.1334893"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.149"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/32\/9116582\/8438933-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/9116582\/08438933.pdf?arnumber=8438933","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:34:37Z","timestamp":1651070077000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8438933\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6,1]]},"references-count":59,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tse.2018.2865935","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,6,1]]}}}