{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T04:18:52Z","timestamp":1775708332712,"version":"3.50.1"},"reference-count":213,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2021,10,1]],"date-time":"2021-10-01T00:00:00Z","timestamp":1633046400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,1]],"date-time":"2021-10-01T00:00:00Z","timestamp":1633046400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,1]],"date-time":"2021-10-01T00:00:00Z","timestamp":1633046400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61502205"],"award-info":[{"award-number":["61502205"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61872167"],"award-info":[{"award-number":["61872167"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2019T120396"],"award-info":[{"award-number":["2019T120396"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002703","name":"Jiangsu University","doi-asserted-by":"publisher","award":["14JDG039"],"award-info":[{"award-number":["14JDG039"]}],"id":[{"id":"10.13039\/501100002703","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002703","name":"Jiangsu University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002703","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Postgraduate Research & Practice Innovation Program of Jiangsu Province","award":["KYCX19_1614"],"award-info":[{"award-number":["KYCX19_1614"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2021,10,1]]},"DOI":"10.1109\/tse.2019.2942921","type":"journal-article","created":{"date-parts":[[2019,9,24]],"date-time":"2019-09-24T01:16:55Z","timestamp":1569287815000},"page":"2052-2083","source":"Crossref","is-referenced-by-count":89,"title":["A Survey on Adaptive Random Testing"],"prefix":"10.1109","volume":"47","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1769-6126","authenticated-orcid":false,"given":"Rubing","family":"Huang","sequence":"first","affiliation":[]},{"given":"Weifeng","family":"Sun","sequence":"additional","affiliation":[]},{"given":"Yinyin","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Haibo","family":"Chen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0877-4353","authenticated-orcid":false,"given":"Dave","family":"Towey","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6302-3256","authenticated-orcid":false,"given":"Xin","family":"Xia","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref170","doi-asserted-by":"publisher","DOI":"10.1007\/BF01932308"},{"key":"ref172","doi-asserted-by":"publisher","DOI":"10.1145\/1375581.1375584"},{"key":"ref171","doi-asserted-by":"publisher","DOI":"10.1016\/0164-1212(84)90030-X"},{"key":"ref174","doi-asserted-by":"publisher","DOI":"10.1587\/transinf.E95.D.2219"},{"key":"ref173","doi-asserted-by":"publisher","DOI":"10.1109\/HICSS.2012.454"},{"key":"ref176","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2013.33"},{"key":"ref175","doi-asserted-by":"publisher","DOI":"10.1145\/3176653.3176711"},{"key":"ref178","doi-asserted-by":"publisher","DOI":"10.1109\/ISSREW.2016.29"},{"key":"ref177","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2015.03.066"},{"key":"ref168","doi-asserted-by":"publisher","DOI":"10.1145\/1883612.1883618"},{"key":"ref169","doi-asserted-by":"publisher","DOI":"10.1109\/2.544239"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-008-9047-6"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/1244002.1244316"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-47984-8_35"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-30502-6_23"},{"key":"ref31","first-page":"141","article-title":"On test case distributions of adaptive random testing","author":"chen","year":"2007","journal-title":"Proc 19th Int Conf Softw Eng Knowl Eng"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2008.22"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2011687"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194006002926"},{"key":"ref35","first-page":"78","article-title":"A revisit of adaptive random testing by restriction","author":"chan","year":"2004","journal-title":"Proc IEEE 28th Annu Int Comput Softw Appl Conf"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44947-7_28"},{"key":"ref181","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2016.49"},{"key":"ref180","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-011-0093-0"},{"key":"ref185","doi-asserted-by":"publisher","DOI":"10.1109\/32.962562"},{"key":"ref184","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2016.19"},{"key":"ref183","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSACW.2010.43"},{"key":"ref182","doi-asserted-by":"publisher","DOI":"10.1145\/2554850.2554854"},{"key":"ref189","doi-asserted-by":"publisher","DOI":"10.1109\/SSIRI.2008.18"},{"key":"ref188","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.02.008"},{"key":"ref187","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2003.1201186"},{"key":"ref186","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2012.15"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2771562"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3143561"},{"key":"ref179","first-page":"126","article-title":"An application of adaptive random sequence in test case prioritization","author":"zhang","year":"2014","journal-title":"Proc 26th Int Conf Softw Eng Knowl Eng"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2017.08.014"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-015-5314-x"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0950-5849(96)01103-2"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/25.4.465"},{"key":"ref24","article-title":"Guidelines for performing systematic literature reviews in software engineering","author":"kitchenham","year":"2007"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2532875"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.03.007"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2006.48"},{"key":"ref51","first-page":"163","article-title":"Controlling restricted random testing: An examination of the exclusion ratio parameter","author":"chen","year":"2007","journal-title":"Proc 19th Int Conf Softw Eng Knowl Eng"},{"key":"ref154","doi-asserted-by":"publisher","DOI":"10.1109\/TST.2014.6919819"},{"key":"ref153","doi-asserted-by":"publisher","DOI":"10.1145\/2559936"},{"key":"ref156","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2011.12"},{"key":"ref155","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-16573-3_6"},{"key":"ref150","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2009.29"},{"key":"ref152","year":"0"},{"key":"ref151","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/843248"},{"key":"ref146","year":"0"},{"key":"ref147","year":"0"},{"key":"ref148","year":"0"},{"key":"ref149","year":"0"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2004.1357947"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/AST.2015.13"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2009.15"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2004.07.004"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2003.1319079"},{"key":"ref54","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1111\/1467-9884.00117","article-title":"Markov Chain Monte Carlo method and its application","volume":"47","author":"stephen","year":"1998","journal-title":"Journal of the Royal Statistical Society Series D (The Statistician)"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.208"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/HASE.2010.11"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368099"},{"key":"ref167","doi-asserted-by":"publisher","DOI":"10.1002\/stv.430"},{"key":"ref166","first-page":"631","article-title":"OFART: OpenFlow-switch adaptive random testing","author":"koo","year":"2016","journal-title":"Proc 10th Int Conf Ubiquitous Inf Technol Appl"},{"key":"ref165","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2015.2487958"},{"key":"ref164","first-page":"49","article-title":"On the preliminary adaptive random testing of aspect-oriented programs","author":"parizi","year":"2011","journal-title":"Proc 6th Int Conf Softw Eng Advances"},{"key":"ref163","year":"0"},{"key":"ref162","doi-asserted-by":"publisher","DOI":"10.1109\/UIC-ATC.2012.77"},{"key":"ref161","year":"0"},{"key":"ref160","year":"0"},{"key":"ref4","first-page":"59","article-title":"An empirical study of the robustness of Windows NT applications using random testing","author":"forrester","year":"2000","journal-title":"Proc 4th USENIX Windows Syst Symp"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/32.707695"},{"key":"ref6","first-page":"1243","article-title":"A genetic approach for random testing of database systems","author":"bati","year":"2007","journal-title":"Proc Int Conf On Very Large Data Bases"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1086228.1086282"},{"key":"ref8","author":"myers","year":"2004","journal-title":"The Art of Software Testing"},{"key":"ref159","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786818"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194017400149"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-13577-4_40"},{"key":"ref157","doi-asserted-by":"publisher","DOI":"10.1145\/2430536.2430540"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(01)00028-0"},{"key":"ref158","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-16573-3_8"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.05.017"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2007.4385507"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(65)90241-X"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-24841-5_16"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2009.77"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1145\/2532443.2532460"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICACSIS.2013.6761550"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/CMPSAC.2004.1342685"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.18"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2006.323184"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1016\/0022-314X(88)90025-X"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1016\/0041-5553(76)90154-3"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1111\/1467-8659.00706"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-2552-2_19"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2455981"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1137\/0713071"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2009.16"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.294"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2013.19"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1145\/1188895.1188903"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1007\/11767077_13"},{"key":"ref63","first-page":"135","article-title":"Enhanced random testing for programs with high dimensional input domains","author":"kuo","year":"2007","journal-title":"Proc 19th Int Conf Softw Eng Knowl Eng"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2010.61"},{"key":"ref65","first-page":"418","article-title":"Dynamic test profiles in adaptive random testing: A case study","author":"liu","year":"2009","journal-title":"Proc 21st Int Conf Softw Eng Knowl Eng"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2011.88"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101957"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.903293"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1145\/355588.365104"},{"key":"ref197","doi-asserted-by":"publisher","DOI":"10.1145\/390013.808479"},{"key":"ref198","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2015.7107451"},{"key":"ref199","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2016.04.009"},{"key":"ref193","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSACW.2010.65"},{"key":"ref194","doi-asserted-by":"publisher","DOI":"10.1109\/QRS-C.2017.60"},{"key":"ref195","doi-asserted-by":"publisher","DOI":"10.1145\/1145735.1145745"},{"key":"ref196","doi-asserted-by":"publisher","DOI":"10.1360\/jos172438"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2017.86"},{"key":"ref94","first-page":"72","article-title":"Adaptive random testing by bisection and localization","author":"mayer","year":"2005","journal-title":"Proc 5th Int Workshop Formal Approaches Softw Testing"},{"key":"ref190","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2015.2491931"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2004.17"},{"key":"ref191","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2015.34"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.06.003"},{"key":"ref192","doi-asserted-by":"publisher","DOI":"10.1145\/1982185.1982268"},{"key":"ref91","first-page":"33","article-title":"Enhanced mirror adaptive random testing based on I\/O relation analysis","author":"nie","year":"2009","journal-title":"Proc Pacific-Asia Conf Knowl Eng Softw Eng"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-016-0087-0"},{"key":"ref98","first-page":"297","article-title":"Adaptive random testing based on two-point partitioning","volume":"36","author":"mao","year":"2012","journal-title":"Informatica"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1145\/1292414.1292418"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1007\/11576280_18"},{"key":"ref97","first-page":"59","article-title":"Restricted adaptive random testing by random partitioning","author":"mayer","year":"2006","journal-title":"Proc 4th Int Conf Softw Eng Res Practice"},{"key":"ref82","first-page":"16","article-title":"Statistical analysis and enhancement of random testing methods also under constrained resources","author":"mayer","year":"2006","journal-title":"Proc 4th Int Conf Softw Eng Res Practice"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2008.24"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1145\/1292414.1292419"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2011.01.025"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2009.71"},{"key":"ref89","first-page":"499","article-title":"Efficient and effective random testing based on partitioning and neighborhood","author":"mayer","year":"2006","journal-title":"Proc 18th Int Conf Softw Eng Knowl Eng"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2017.13"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1137\/S0036144599352836"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/ASWEC.2007.20"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2008.03.062"},{"key":"ref200","doi-asserted-by":"publisher","DOI":"10.5120\/16218-5662"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1145\/1529282.1529376"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101963"},{"key":"ref209","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1486"},{"key":"ref203","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-22418-8_38"},{"key":"ref204","doi-asserted-by":"crossref","first-page":"146","DOI":"10.1109\/QSIC.2004.1357955","article-title":"On the statistical properties of the F-measure","author":"chen","year":"2004","journal-title":"Proc 4th Int Conf Quality Softw"},{"key":"ref201","doi-asserted-by":"publisher","DOI":"10.1109\/KBEI.2015.7436097"},{"key":"ref202","doi-asserted-by":"publisher","DOI":"10.1145\/2975954.2975959"},{"key":"ref207","doi-asserted-by":"publisher","DOI":"10.1002\/spe.1113"},{"key":"ref208","doi-asserted-by":"publisher","DOI":"10.1145\/267580.267590"},{"key":"ref205","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2005.05.029"},{"key":"ref206","doi-asserted-by":"publisher","DOI":"10.1145\/1363102.1363107"},{"key":"ref211","doi-asserted-by":"publisher","DOI":"10.1037\/0033-2909.112.1.155"},{"key":"ref210","author":"tijms","year":"2004","journal-title":"Understanding Probability Chance Rules in Everyday Life"},{"key":"ref212","first-page":"101","article-title":"A critique and improvment of the CL common language effect size statistics of mcgraw and wong","volume":"25","author":"vargha","year":"2000","journal-title":"Journal of Educational and Behavioral Statistics"},{"key":"ref213","year":"0"},{"key":"ref127","doi-asserted-by":"publisher","DOI":"10.1145\/62959.62964"},{"key":"ref126","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2006.43"},{"key":"ref125","doi-asserted-by":"publisher","DOI":"10.1145\/116873.116880"},{"key":"ref124","doi-asserted-by":"publisher","DOI":"10.1109\/ASWEC.2006.25"},{"key":"ref129","first-page":"306","article-title":"On the relationships between the distribution of failure-causing inputs and effectiveness of adaptive random testing","author":"chen","year":"2005","journal-title":"Proc 17th Int Conf Softw Eng Knowl Eng"},{"key":"ref128","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2547380"},{"key":"ref130","author":"bellman","year":"1957","journal-title":"Dynamic Programming"},{"key":"ref133","article-title":"Association for Computing Machinery","year":"1980"},{"key":"ref134","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001452"},{"key":"ref131","doi-asserted-by":"publisher","DOI":"10.1145\/2480362.2480562"},{"key":"ref132","author":"press","year":"1986","journal-title":"Numerical Recipes"},{"key":"ref136","year":"0"},{"key":"ref135","author":"cormen","year":"2001","journal-title":"Introduction to Algorithms"},{"key":"ref138","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2017.30"},{"key":"ref137","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-005-3861-2"},{"key":"ref139","year":"0"},{"key":"ref140","year":"0"},{"key":"ref141","doi-asserted-by":"publisher","DOI":"10.1145\/1145735.1145744"},{"key":"ref142","year":"0"},{"key":"ref143","year":"0"},{"key":"ref2","year":"2010","journal-title":"ISO\/IEC\/IEEE International Standard-Systems and software engineering–Vocabulary"},{"key":"ref144","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2628759"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2593882.2593885"},{"key":"ref145","year":"0"},{"key":"ref109","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2008.23"},{"key":"ref108","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194007003501"},{"key":"ref107","doi-asserted-by":"publisher","DOI":"10.1002\/spe.1067"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33119-0_11"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2034288"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2006.8"},{"key":"ref103","first-page":"147","article-title":"Adaptive random testing through dynamic partitioning by localization with restriction and enlarged input domain","author":"sabor","year":"2012","journal-title":"Proc 1st Int Conf Inf Technol Softw Eng"},{"key":"ref102","first-page":"1","article-title":"Adaptive random testing through dynamic partitioning by localization with distance and enlarged input domain","volume":"1","author":"sabor","year":"2012","journal-title":"International Journal of Innovative Technology and Exploring Engineering"},{"key":"ref111","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1983.236871"},{"key":"ref112","doi-asserted-by":"publisher","DOI":"10.1145\/356651.356652"},{"key":"ref110","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2240898"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1980.234486"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/12.2185"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(91)90052-9"},{"key":"ref13","first-page":"98","article-title":"The variation of software survival times for different operational input profiles","author":"bishop","year":"1993","journal-title":"Proc 23rd Int Symp Fault-Tolerant Comput"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1295074.1295091"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.02.022"},{"key":"ref16","first-page":"71","article-title":"Using the information: Incorporating positive feedback information into the testing process","author":"chan","year":"2003","journal-title":"Proc 7th Annu Int Workshop Softw Technol Eng Practice"},{"key":"ref118","first-page":"v1?298","article-title":"A new method to solve the boundary effect of adaptive random testing","author":"geng","year":"2010","journal-title":"Proc 7th Int Conf Educ Inf Technol"},{"key":"ref17","first-page":"1","article-title":"Adaptive random testing; ubiquitous testing to support ubiquitous computing","author":"towey","year":"2007","journal-title":"Proc Int Conf Korea Soc Inf Technol 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Technol"},{"key":"ref115","doi-asserted-by":"publisher","DOI":"10.1109\/DICTA.2014.7008093"},{"key":"ref120","doi-asserted-by":"publisher","DOI":"10.1145\/1145735.1145746"},{"key":"ref121","doi-asserted-by":"publisher","DOI":"10.1145\/1143997.1144323"},{"key":"ref122","doi-asserted-by":"publisher","DOI":"10.1145\/1159733.1159751"},{"key":"ref123","first-page":"292","article-title":"Adaptive random testing with filtering: An overhead reduction technique","author":"chan","year":"2005","journal-title":"Proc 17th Int Conf Softw Eng Knowl Eng"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/9573514\/08846002.pdf?arnumber=8846002","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:50:06Z","timestamp":1652194206000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8846002\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,1]]},"references-count":213,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tse.2019.2942921","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,10,1]]}}}