{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T18:00:18Z","timestamp":1772042418459,"version":"3.50.1"},"reference-count":78,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"NSFC-Key","award":["61933013"],"award-info":[{"award-number":["61933013"]}]},{"name":"NSFC-Key Project of General Technology Fundamental Research United Fund","award":["U1736211"],"award-info":[{"award-number":["U1736211"]}]},{"DOI":"10.13039\/501100003453","name":"Natural Science Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2019A1515011076"],"award-info":[{"award-number":["2019A1515011076"]}],"id":[{"id":"10.13039\/501100003453","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003819","name":"Natural Science Foundation of Hubei Province","doi-asserted-by":"publisher","award":["2018CFA024"],"award-info":[{"award-number":["2018CFA024"]}],"id":[{"id":"10.13039\/501100003819","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Innovation Group of Guangdong Education Department","award":["2018KCXTD019"],"award-info":[{"award-number":["2018KCXTD019"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61902228"],"award-info":[{"award-number":["61902228"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["GK201903086"],"award-info":[{"award-number":["GK201903086"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2021,12,1]]},"DOI":"10.1109\/tse.2020.2968520","type":"journal-article","created":{"date-parts":[[2020,1,21]],"date-time":"2020-01-21T21:29:07Z","timestamp":1579642147000},"page":"2803-2822","source":"Crossref","is-referenced-by-count":51,"title":["An Empirical Study on Heterogeneous Defect Prediction Approaches"],"prefix":"10.1109","volume":"47","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9255-6772","authenticated-orcid":false,"given":"Haowen","family":"Chen","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0392-8475","authenticated-orcid":false,"given":"Xiao-Yuan","family":"Jing","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5999-3658","authenticated-orcid":false,"given":"Zhiqiang","family":"Li","sequence":"additional","affiliation":[]},{"given":"Di","family":"Wu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7881-5603","authenticated-orcid":false,"given":"Yi","family":"Peng","sequence":"additional","affiliation":[]},{"given":"Zhiguo","family":"Huang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref73","first-page":"1","article-title":"Kernel independent component analysis","volume":"3","author":"bach","year":"2002","journal-title":"J Mach Learn Res"},{"key":"ref72","first-page":"321","article-title":"Learning with local and global consistency","author":"zhou","year":"2003","journal-title":"Proc 16th Int Conf Neural Inf Process Syst"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2010.173"},{"key":"ref70","first-page":"1439","article-title":"Use of the zero-norm with linear models and kernel methods","volume":"3","author":"weston","year":"2003","journal-title":"J Mach Learn Res"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/34.598228"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-008-9079-3"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1002\/9781118646106.ch4"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1162\/0899766042321814"},{"key":"ref75","first-page":"1157","article-title":"An introduction to variable and feature selection","volume":"3","author":"guyon","year":"2003","journal-title":"J Mach Learn Res"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.91"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2553030"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025120"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2013.11"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2804922"},{"key":"ref30","article-title":"Towards cross-project defect prediction with imbalanced feature sets","author":"he","year":"2014","journal-title":"CoRR"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2008.35"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2010.5463279"},{"key":"ref35","first-page":"1","article-title":"Towards identifying software project clusters with regard to defect prediction","author":"marian","year":"2010","journal-title":"Proc 6th Int Conf Predictive Models Softw Eng"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9173-9"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884839"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2748129"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1145\/2393596.2393669"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177731944"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786813"},{"key":"ref64","first-page":"1","article-title":"Statistical comparisons of classifiers over multiple data sets","volume":"7","author":"dem\u0161ar","year":"2006","journal-title":"J Mach Learn Res"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2543218"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2584050"},{"key":"ref66","first-page":"460","article-title":"Towards logistic regression models for predicting fault-prone code across software projects","author":"camargo cruz","year":"2009","journal-title":"Proc 3rd Int Symp Empir Softw Eng Meas"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786814"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2597849"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1570"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2015.56"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.70"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2002.1019484"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595713"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.09.007"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.01.014"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2013.6624057"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606584"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2012.10.003"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-014-9346-4"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2724538"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1145\/3183339"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884857"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.92"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2013.6"},{"key":"ref56","first-page":"528","article-title":"Goal question metric paradigm","volume":"2","author":"basili","year":"1994","journal-title":"Encyclopaedia of Software Eng"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-017-0089-0"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-016-0043-6"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884804"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-015-9396-2"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-015-0179-1"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-016-0194-x"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2720603"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070510"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2013.6693087"},{"key":"ref14","first-page":"284","article-title":"Use of relative code churn measures to predict system defect density","author":"nachiappan","year":"2005","journal-title":"Proc 27th Int l Conf Software Eng"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.25"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368161"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-011-0090-3"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-011-0092-1"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-008-9103-7"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.43"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2007.66"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.07.040"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1610"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70773"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2568225.2568320"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.03.006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.256941"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1658"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1142\/S012906570000034X"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2780222"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2016.7472196"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2017.06.070"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.18293\/SEKE2016-090"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-017-0220-7"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME.2017.19"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/9646454\/08964460.pdf?arnumber=8964460","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:50:07Z","timestamp":1652194207000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8964460\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12,1]]},"references-count":78,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tse.2020.2968520","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,12,1]]}}}